X-ray ptychography using randomized zone plates

Morrison, G. R.; Zhang, F.; Gianoncelli, A.; Robinson, I. K.

doi:10.1364/OE.26.014915

Title: X-ray ptychography using randomized zone plates

Journal Article · Tue May 29 00:00:00 EDT 2018 · Optics Express

DOI:https://doi.org/10.1364/OE.26.014915· OSTI ID:1439489

; Zhang, F.; Gianoncelli, A.; Robinson, I. K.

We have developed a randomized grating condenser zone plate (GCZP) that provides a μm-scale probe for use in x-ray ptychography. This delivers a significantly better x-ray throughput than probes defined by pinhole apertures, while providing a clearly-defined level of phase diversity to the illumination on the sample, and helping to reduce the dynamic range of the detected signal by spreading the zero-order light over an extended area of the detector. The first use of this novel x-ray optical element has been demonstrated successfully for both amplitude and phase contrast imaging using soft x-rays on the TwinMic beamline at the Elettra synchrotron.

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC00112704; SC0012704

OSTI ID:: 1439489

Alternate ID(s):: OSTI ID: 1436451

Report Number(s):: BNL-203644-2018-JAAM; OPEXFF

Journal Information:: Optics Express, Journal Name: Optics Express Vol. 26 Journal Issue: 12; ISSN 1094-4087

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 9 works

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