Soft X-ray spectromicroscopy and ptychography
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1249971
- Resource Type:
- Journal Article: Publisher's Accepted Manuscript
- Journal Name:
- Journal of Electron Spectroscopy and Related Phenomena
- Additional Journal Information:
- Journal Name: Journal of Electron Spectroscopy and Related Phenomena Journal Volume: 200 Journal Issue: C; Journal ID: ISSN 0368-2048
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Hitchcock, Adam P. Soft X-ray spectromicroscopy and ptychography. Netherlands: N. p., 2015.
Web. doi:10.1016/j.elspec.2015.05.013.
Hitchcock, Adam P. Soft X-ray spectromicroscopy and ptychography. Netherlands. https://doi.org/10.1016/j.elspec.2015.05.013
Hitchcock, Adam P. 2015.
"Soft X-ray spectromicroscopy and ptychography". Netherlands. https://doi.org/10.1016/j.elspec.2015.05.013.
@article{osti_1249971,
title = {Soft X-ray spectromicroscopy and ptychography},
author = {Hitchcock, Adam P.},
abstractNote = {},
doi = {10.1016/j.elspec.2015.05.013},
url = {https://www.osti.gov/biblio/1249971},
journal = {Journal of Electron Spectroscopy and Related Phenomena},
issn = {0368-2048},
number = C,
volume = 200,
place = {Netherlands},
year = {Wed Apr 01 00:00:00 EDT 2015},
month = {Wed Apr 01 00:00:00 EDT 2015}
}
Free Publicly Available Full Text
Publisher's Version of Record at https://doi.org/10.1016/j.elspec.2015.05.013
Other availability
Cited by: 56 works
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