Advanced denoising for X-ray ptychography

Chang, Huibin; Enfedaque, Pablo; Zhang, Jie; Reinhardt, Juliane; Enders, Bjoern; Yu, Young-Sang; Shapiro, David; Schroer, Christian G.; Zeng, Tieyong; Marchesini, Stefano

doi:10.1364/OE.27.010395

Advanced denoising for X-ray ptychography

Journal Article · Mon Apr 01 00:00:00 EDT 2019 · Optics Express

DOI:https://doi.org/10.1364/OE.27.010395· OSTI ID:1504305

; Enfedaque, Pablo; Zhang, Jie; Reinhardt, Juliane; Enders, Bjoern; Yu, Young-Sang; Shapiro, David; Schroer, Christian G.; Zeng, Tieyong;

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Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1504305

Journal Information:: Optics Express, Journal Name: Optics Express Journal Issue: 8 Vol. 27; ISSN 1094-4087; ISSN OPEXFF

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

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