Surface Channeling in Aberration-Corrected Scanning Transmission Electron Microscopy of Nanostructures

Liu, Jingyue; Allard, Jr., Lawrence Frederick

doi:10.1017/S1431927610000450

Surface Channeling in Aberration-Corrected Scanning Transmission Electron Microscopy of Nanostructures

Journal Article · Thu Jul 01 00:00:00 EDT 2010 · Microscopy and Microanalysis

DOI:https://doi.org/10.1017/S1431927610000450· OSTI ID:1435348

Liu, Jingyue ^[1]; ^[2]

Univ. of Missouri-St. Louis, St. Louis, MO (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Here, the aberration-corrected scanning transmission electron microscope can provide information on nanostructures with sub-Ångström image resolution. The relatively intuitive interpretation of high-angle annular dark-field (HAADF) imaging technique makes it a popular tool to image a variety of samples and finds broad applications to characterizing nanostructures, especially when combined with electron energy-loss spectroscopy and X-ray energy-dispersive spectroscopy techniques. To quantitatively interpret HAADF images, however, requires full understanding of the various types of signals that contribute to the HAADF image contrast. We have observed significant intensity enhancement in HAADF images, and large expansion of lattice spacings, of surface atoms of atomically flat ZnO surfaces. The surface-resonance channeling effect, one of the electron-beam channeling phenomena in crystalline nanostructures, was invoked to explain the observed image intensity enhancement. A better understanding of the effect of electron beam channeling along surfaces or interfaces on HAADF image contrast may have implications for quantifying HAADF images and may provide new routes to utilize the channeling phenomenon to study surface structures with sub-Ångström spatial resolution.

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC05-00OR22725

OSTI ID:: 1435348

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 04 Vol. 16; ISSN 1431-9276; ISSN applab

Publisher:: Microscopy Society of America (MSA)

Country of Publication:: United States

Language:: English

References (36)

Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory Blom, Douglas A.; Allard, Lawrence F.; Mishina, Satoshi Microscopy and Microanalysis, Vol. 12, Issue 6 https://doi.org/10.1017/S1431927606060570	journal	October 2006
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun Sawada, H.; Tanishiro, Y.; Ohashi, N. Journal of Electron Microscopy, Vol. 58, Issue 6 https://doi.org/10.1093/jmicro/dfp030	journal	June 2009
Effects of electron channeling in HAADF-STEM intensity in La2CuSnO6 Haruta, M.; Kurata, H.; Komatsu, H. Ultramicroscopy, Vol. 109, Issue 4 https://doi.org/10.1016/j.ultramic.2009.01.004	journal	March 2009
Imaging elastic strains in high-angle annular dark field scanning transmission electron microscopy Perovic, D. D.; Rossouw, C. J.; Howie, A. Ultramicroscopy, Vol. 52, Issue 3-4 https://doi.org/10.1016/0304-3991(93)90046-Z	journal	December 1993
Simulating high-angle annular dark-field stem images including inelastic thermal diffuse scattering Wang, Z. L.; Cowley, J. M. Ultramicroscopy, Vol. 31, Issue 4 https://doi.org/10.1016/0304-3991(89)90340-9	journal	December 1989
Scanning reflection electron microscopy and associated techniques for surface studies Liu, J.; Cowley, J. M. Ultramicroscopy, Vol. 48, Issue 4 https://doi.org/10.1016/0304-3991(93)90116-F	journal	April 1993
Atomic scale high-angle annular dark field STEM analysis of the N configuration in dilute nitrides of GaAs Herrera, M.; Ramasse, Q. M.; Morgan, D. G. Physical Review B, Vol. 80, Issue 12 https://doi.org/10.1103/PhysRevB.80.125211	journal	September 2009
Sub-ångstrom resolution using aberration corrected electron optics Batson, P. E.; Dellby, N.; Krivanek, O. L. Nature, Vol. 418, Issue 6898 https://doi.org/10.1038/nature00972	journal	August 2002
De-channelling contrast in annular dark-field STEM Cowley, J. M.; Huang, Yi Ultramicroscopy, Vol. 40, Issue 2 https://doi.org/10.1016/0304-3991(92)90058-R	journal	February 1992
Incoherent Imaging of Thin Specimens Using Coherently Scattered Electrons Jesson, D. E.; Pennycook, S. J. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 441, Issue 1912 https://doi.org/10.1098/rspa.1993.0060	journal	May 1993
Direct Sub-Angstrom Imaging of a Crystal Lattice Nellist, P. D. Science, Vol. 305, Issue 5691 https://doi.org/10.1126/science.1100965	journal	September 2004
Atomic-resolution spectroscopic imaging: past, present and future Pennycook, S. J.; Varela, M.; Lupini, A. R. Journal of Electron Microscopy, Vol. 58, Issue 3 https://doi.org/10.1093/jmicro/dfn030	journal	January 2009
Nanobelts of Semiconducting Oxides Pan, Z. W. Science, Vol. 291, Issue 5510, p. 1947-1949 https://doi.org/10.1126/science.1058120	journal	March 2001
Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces Yu, Z.; Muller, D. A.; Silcox, J. Ultramicroscopy, Vol. 108, Issue 5 https://doi.org/10.1016/j.ultramic.2007.08.007	journal	April 2008
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit Kisielowski, C.; Freitag, B.; Bischoff, M. Microscopy and Microanalysis, Vol. 14, Issue 5 https://doi.org/10.1017/S1431927608080902	journal	September 2008
Atomic-Resolution Imaging with a Sub-50-pm Electron Probe Erni, Rolf; Rossell, Marta D.; Kisielowski, Christian Physical Review Letters, Vol. 102, Issue 9 https://doi.org/10.1103/PhysRevLett.102.096101	journal	March 2009
Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector Sawada, Hidetaka; Hosokawa, Fumio; Kaneyama, Toshikatsu Japanese Journal of Applied Physics, Vol. 46, Issue No. 23 https://doi.org/10.1143/JJAP.46.L568	journal	June 2007
Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction Watanabe, M.; Ackland, D. W.; Burrows, A. Microscopy and Microanalysis, Vol. 12, Issue 6 https://doi.org/10.1017/S1431927606060703	journal	October 2006
Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope Varela, M.; Lupini, A. R.; Benthem, K. van Annual Review of Materials Research, Vol. 35, Issue 1 https://doi.org/10.1146/annurev.matsci.35.102103.090513	journal	August 2005
Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems Liu, Jingyue Microscopy, Vol. 54, Issue 3 https://doi.org/10.1093/jmicro/dfi034	journal	June 2005
Electron resonance reflections from perfect crystal surfaces and surfaces with steps Wang, Z. L.; Liu, J.; Lu, Ping Ultramicroscopy, Vol. 27, Issue 1 https://doi.org/10.1016/0304-3991(89)90204-0	journal	January 1989
High-resolution incoherent imaging of crystals Pennycook, S.; Jesson, D. Physical Review Letters, Vol. 64, Issue 8 https://doi.org/10.1103/PhysRevLett.64.938	journal	February 1990
Quantitative Atomic Resolution Scanning Transmission Electron Microscopy LeBeau, James M.; Findlay, Scott D.; Allen, Leslie J. Physical Review Letters, Vol. 100, Issue 20 https://doi.org/10.1103/PhysRevLett.100.206101	journal	May 2008
Observations of surface-channelling phenomena with a stem instrument Cowley, J. M. Ultramicroscopy, Vol. 27, Issue 3 https://doi.org/10.1016/0304-3991(89)90022-3	journal	April 1989
Convergent-beam reflection high-energy electron diffraction (RHEED) observations from an Si(111) surface Lehmpfuhl, G.; Dowell, W. C. T. Acta Crystallographica Section A Foundations of Crystallography, Vol. 42, Issue 6 https://doi.org/10.1107/S0108767386098720	journal	November 1986
Effects of amorphous layers on ADF-STEM imaging Mkhoyan, K. A.; Maccagnano-Zacher, S. E.; Kirkland, E. J. Ultramicroscopy, Vol. 108, Issue 8 https://doi.org/10.1016/j.ultramic.2008.01.007	journal	July 2008
Effects of tilt on high-resolution ADF-STEM imaging Maccagnano-Zacher, S. E.; Mkhoyan, K. A.; Kirkland, E. J. Ultramicroscopy, Vol. 108, Issue 8 https://doi.org/10.1016/j.ultramic.2007.11.003	journal	July 2008
The effect of surface strain relaxation on HAADF imaging Grillo, V. Ultramicroscopy, Vol. 109, Issue 12 https://doi.org/10.1016/j.ultramic.2009.07.010	journal	November 2009
Study of strain fields at a-Si/c-Si interface Yu, Zhiheng; Muller, David A.; Silcox, John Journal of Applied Physics, Vol. 95, Issue 7 https://doi.org/10.1063/1.1649463	journal	April 2004
Detector geometry, thermal diffuse scattering and strain effects in ADF STEM imaging Hillyard, Sean; Silcox, John Ultramicroscopy, Vol. 58, Issue 1 https://doi.org/10.1016/0304-3991(94)00173-K	journal	April 1995
Experimental quantification of annular dark-field images in scanning transmission electron microscopy LeBeau, James M.; Stemmer, Susanne Ultramicroscopy, Vol. 108, Issue 12 https://doi.org/10.1016/j.ultramic.2008.07.001	journal	November 2008
An electron microscope for the aberration-corrected era Krivanek, O. L.; Corbin, G. J.; Dellby, N. Ultramicroscopy, Vol. 108, Issue 3 https://doi.org/10.1016/j.ultramic.2007.07.010	journal	February 2008
Lattice-resolution contrast from a focused coherent electron probe. Part I Allen, L. J.; Findlay, S. D.; Oxley, M. P. Ultramicroscopy, Vol. 96, Issue 1 https://doi.org/10.1016/S0304-3991(02)00380-7	journal	July 2003
Channelling effects in atomic resolution STEM Rossouw, C. J.; Allen, L. J.; Findlay, S. D. Ultramicroscopy, Vol. 96, Issue 3-4 https://doi.org/10.1016/S0304-3991(03)00095-0	journal	September 2003
Surface channelling effects in electron holograms Cowley, J. M. Ultramicroscopy, Vol. 31, Issue 2 https://doi.org/10.1016/0304-3991(89)90217-9	journal	October 1989
Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy Muller, D. A.; Kourkoutis, L. F.; Murfitt, M. Science, Vol. 319, Issue 5866 https://doi.org/10.1126/science.1148820	journal	February 2008

Similar Records

Surface Channeling in Aberration-corrected STEM of Nanostructures

Conference · Thu Dec 31 23:00:00 EST 2009 · OSTI ID:1362182

Atomic structure of three-layer Au/Pd nanoparticles revealed by aberration-corrected scanning transmission electron microscopy

Journal Article · Wed Mar 19 00:00:00 EDT 2008 · Journal of Materials Chemistry · OSTI ID:1361280

Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope

Journal Article · Fri Dec 31 23:00:00 EST 2004 · Annual Review of Materials Research · OSTI ID:1003155

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
HAADF
STEM
ZnO
aberration-free electron microscope
channeling
electron microscope
nanostructure
surface

Surface Channeling in Aberration-Corrected Scanning Transmission Electron Microscopy of Nanostructures

Citation Formats

References (36)

Similar Records

Related Subjects