Surface Channeling in Aberration-corrected STEM of Nanostructures

Conference · Fri Jan 01 04:00:00 EST 2010

DOI:https://doi.org/10.1017/S143192761005991X· OSTI ID:1362182

Liu, Prof. Jimmy ^[1]; Allard, Jr, Lawrence Frederick ^[2]

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1. University of Missouri, St. Louis
2. ORNL

Sub- ngstr m resolution imaging and atomic resolution spectroscopy in aberration-corrected STEM are becoming routinely available, providing information on crystal structure, defect structure, elemental composition, and electronic structure with a sensitivity of, or approaching, individual atoms. To quantitatively interpret image intensities, however, requires a better understanding of the origin of the collected signals. We report here observation of anomalous intensity enhancement in sub- ngstr m resolution HAADF images of surfaces and interfaces of ZnO nanostructures. We propose that the significant increase of the collected HAADF signal of a row of atom columns close to the crystal surface originates from a surface-resonance channeling effect [1].

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). High Temperature Materials Laboratory (HTML)
• Sponsoring Organization: EE USDOE - Office of Energy Efficiency and Renewable Energy (EE)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1362182
• Country of Publication: United States
• Language: English

Related Subjects

STEM
ZnO
aberration-correction
anomalous intensity
nanobelts
sub- ngstr m
surface channelling