Visible-blind and solar-blind detection induced by defects in AlGaN high electron mobility transistors

Armstrong, Andrew M.; Klein, Brianna; Allerman, Andrew A.; Douglas, Erica A.; Baca, Albert G.; Crawford, Mary H.; Pickrell, Greg W.; Sanchez, Carlos A.

doi:10.1063/1.4997605

Visible-blind and solar-blind detection induced by defects in AlGaN high electron mobility transistors

Journal Article · Wed Mar 21 00:00:00 EDT 2018 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4997605· OSTI ID:1427323

^[1]; Klein, Brianna ^[1]; Allerman, Andrew A. ^[1]; Douglas, Erica A. ^[1]; Baca, Albert G. ^[1]; Crawford, Mary H. ^[1]; ^[1]; Sanchez, Carlos A. ^[1]

Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

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Sponsoring Organization:: USDOE

OSTI ID:: 1427323

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 123; ISSN 0021-8979

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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