Stiffness relations for piezoelectric indentation of flat and non-flat punches of arbitrary planform: Applications to probing nanoelectromechanical properties of materials
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April 2009 |
Sub-surface AFM imaging using tip generated stress and electric fields
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March 2017 |
Simultaneous elastic and electromechanical imaging by scanning probe microscopy: Theory and applications to ferroelectric and biological materials
- Shin, J.; Rodriguez, B. J.; Baddorf, A. P.
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 23, Issue 5
https://doi.org/10.1116/1.2052714
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January 2005 |
Indentation induced mechanical and electrical response in ferroelectric crystal investigated by acoustic mode AFM
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January 2005 |
Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy
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January 2015 |
Determination of shear stiffness based on thermal noise analysis in atomic force microscopy: Passive overtone microscopy
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June 2001 |
Advances in quantitative nanoscale subsurface imaging by mode-synthesizing atomic force microscopy
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August 2014 |
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
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September 2007 |
Acoustic microscopy by atomic force microscopy
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March 1994 |
Local Elasticity Response in Ferroelectric Crystals Studied by Afm-Based Novel Probe Techniques
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November 2006 |
Piezoelectric nanoindentation
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March 2006 |
Nanoelectromechanics of polarization switching in piezoresponse force microscopy
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April 2005 |
Enhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequency
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March 2005 |
Elastic phase response of silica nanoparticles buried in soft matter
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September 2008 |
Local thermomechanical characterization of phase transitions using band excitation atomic force acoustic microscopy with heated probe
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August 2008 |
Dual-frequency resonance-tracking atomic force microscopy
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October 2007 |
Mode-synthesizing atomic force microscopy for 3D reconstruction of embedded low-density dielectric nanostructures
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May 2015 |
Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy
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June 2004 |
An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments
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June 1992 |
High-resolution characterization of piezoelectric ceramics by ultrasonic scanning force microscopy techniques
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October 2002 |
Nanoelectromechanics of piezoresponse force microscopy
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November 2004 |
Relationship between direct and converse piezoelectric effect in a nanoscale electromechanical contact
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December 2007 |
Piezoelectric indentation of a flat circular punch accompanied by frictional sliding and applications to scanning probe microscopy
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February 2009 |
Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy
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September 2010 |
Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging
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April 2014 |
Nanoelectromechanics of piezoelectric indentation and applications to scanning probe microscopies of ferroelectric materials
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April 2005 |
Indentation of spherical and conical punches into piezoelectric half-space with frictional sliding: Applications to scanning probe microscopy
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August 2007 |
Local Elasticity Response in Ferroelectric Crystals Studied by Afm-Based Novel Probe Techniques
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September 2005 |
Elastic-property measurements of ultrathin films using atomic force acoustic microscopy
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April 2005 |
Visualization of Au Nanoparticles Buried in a Polymer Matrix by Scanning Thermal Noise Microscopy
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February 2017 |
The emergence of multifrequency force microscopy
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April 2012 |
New modes for subsurface atomic force microscopy through nanomechanical coupling
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December 2009 |
Atomic force acoustic microscopy methods to determine thin-film elastic properties
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August 2003 |
Point force and generalized point source on the surface of semi-infinite transversely isotropic material
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September 2011 |
Probing the temperature dependence of the mechanical properties of polymers at the nanoscale with band excitation thermal scanning probe microscopy
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September 2009 |
Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification
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June 2008 |
Nanoelectromechanics of Piezoresponse Force Microscopy: Contact Properties, Fields Below the Surface and Polarization Switching
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January 2003 |