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Title: PRELIMINARY TEST RESULTS OF A PROTOTYPE FAST KICKER FOR APS MBA UPGRADE

Abstract

The APS multi-bend achromatic (MBA) upgrade storage ring plans to support two bunch fill patterns: a 48-bunch and a 324-bunch. A “swap out” injection scheme is required. In order to provide the required kick to injected beam, to minimize the beam loss and residual oscillation of injected beam, and to minimize the perturbation to stored beam during injection, the rise, fall, and flat-top parts of the kicker pulse must be within a 16.9-ns interval. Stripline-type kickers are chosen for both injection and extraction. We developed a prototype kicker that supports a ±15kV differential pulse voltage. We performed high voltage discharge, TDR measurement, high voltage pulse test and beam test of the kicker. We report the final design of the fast kicker and the test results.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1389059
DOE Contract Number:
AC02-06CH11357
Resource Type:
Conference
Resource Relation:
Conference: 2016 North American Particle Accelerator Conference, 10/09/16 - 10/14/16, Chicago, IL, US
Country of Publication:
United States
Language:
English
Subject:
APS MBA UPGRADE; PROTOTYPE FAST KICKER

Citation Formats

Yao, C.-Y., Morrison, L., Sun, X., Wang, J., Cours, A., Westferro, F., Xiao, A., Clute, T., Conway, Z., Decker, G., Lenkszus, F., Carwardine, J., Barcikowski, A., Keane, R., and Brill, A.. PRELIMINARY TEST RESULTS OF A PROTOTYPE FAST KICKER FOR APS MBA UPGRADE. United States: N. p., 2017. Web. doi:10.18429.
Yao, C.-Y., Morrison, L., Sun, X., Wang, J., Cours, A., Westferro, F., Xiao, A., Clute, T., Conway, Z., Decker, G., Lenkszus, F., Carwardine, J., Barcikowski, A., Keane, R., & Brill, A.. PRELIMINARY TEST RESULTS OF A PROTOTYPE FAST KICKER FOR APS MBA UPGRADE. United States. doi:10.18429.
Yao, C.-Y., Morrison, L., Sun, X., Wang, J., Cours, A., Westferro, F., Xiao, A., Clute, T., Conway, Z., Decker, G., Lenkszus, F., Carwardine, J., Barcikowski, A., Keane, R., and Brill, A.. Sun . "PRELIMINARY TEST RESULTS OF A PROTOTYPE FAST KICKER FOR APS MBA UPGRADE". United States. doi:10.18429. https://www.osti.gov/servlets/purl/1389059.
@article{osti_1389059,
title = {PRELIMINARY TEST RESULTS OF A PROTOTYPE FAST KICKER FOR APS MBA UPGRADE},
author = {Yao, C.-Y. and Morrison, L. and Sun, X. and Wang, J. and Cours, A. and Westferro, F. and Xiao, A. and Clute, T. and Conway, Z. and Decker, G. and Lenkszus, F. and Carwardine, J. and Barcikowski, A. and Keane, R. and Brill, A.},
abstractNote = {The APS multi-bend achromatic (MBA) upgrade storage ring plans to support two bunch fill patterns: a 48-bunch and a 324-bunch. A “swap out” injection scheme is required. In order to provide the required kick to injected beam, to minimize the beam loss and residual oscillation of injected beam, and to minimize the perturbation to stored beam during injection, the rise, fall, and flat-top parts of the kicker pulse must be within a 16.9-ns interval. Stripline-type kickers are chosen for both injection and extraction. We developed a prototype kicker that supports a ±15kV differential pulse voltage. We performed high voltage discharge, TDR measurement, high voltage pulse test and beam test of the kicker. We report the final design of the fast kicker and the test results.},
doi = {10.18429},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jun 25 00:00:00 EDT 2017},
month = {Sun Jun 25 00:00:00 EDT 2017}
}

Conference:
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  • A prototype dual-blade stripline kicker for the APS multi-bend achromat (MBA) upgrade has been designed and developed. It was optimized with 3D CST Microwave Studio. The high voltage (HV) feedthrough and air-side connector were designed and optimized. Electromagnetic fields along the beam path, the deflecting angle, the high electric fields and their locations were calculated with 15kV differential pulse voltage applied to the kicker blades through the feedthroughs. Beam impedance and the power dissipation on different parts of the kicker and external loads were studied for a 48-bunch fill pattern. Our results show that the prototype kicker with its HVmore » feedthroughs meets the specified requirements. The results of TDR (time-domain reflectometer) test, high voltage pulse test and beam test of the prototype kicker assembly agreed with the simulations.« less
  • Three fast kicker units have been designed, tested, and installed in the positron accumulator ring (PAR) at the Advanced Photon Source (APS) for beam injection and extraction. The performance of these kicker units has been satisfactory. This presents the design and test results.
  • Beam diagnostics required for the APS Multi-bend acromat (MBA) are driven by ambitious beam stability requirements. The major AC stability challenge is to correct rms beam motion to 10% the rms beam size at the insertion device source points from0.01 to 1000 Hz. The vertical plane represents the biggest challenge forAC stability, which is required to be 400 nm rms for a 4-micron vertical beam size. In addition to AC stability, long-term drift over a period of seven days is required to be 1 micron or less. Major diagnostics R&D components include improved rf beam position processing using commercially availablemore » FPGA-based BPM processors, new X-ray beam position monitors based on hard X-ray fluorescence from copper and Compton scattering off diamond, mechanical motion sensing to detect and correct long-term vacuum chamber drift, a new feedback system featuring a tenfold increase in sampling rate, and a several-fold increase in the number of fast correctors and BPMs in the feedback algorithm. Feedback system development represents a major effort, and we are pursuing development of a novel algorithm that integrates orbit correction for both slow and fast correctors down to DC simultaneously. Finally, a new data acquisition system (DAQ) is being developed to simultaneously acquire streaming data from all diagnostics as well as the feedback processors for commissioning and fault diagnosis. Results of studies and the design effort are reported.« less