Tailoring Heterovalent Interface Formation with Light
Journal Article
·
· Scientific Reports
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
Integrating different semiconductor materials into an epitaxial device structure offers additional degrees of freedom to select for optimal material properties in each layer. However, interface between materials with different valences (i.e. III-V, II-VI and IV semiconductors) can be difficult to form with high quality. Using ZnSe/GaAs as a model system, we explore the use of UV illumination during heterovalent interface growth by molecular beam epitaxy as a way to modify the interface properties. We find that UV illumination alters the mixture of chemical bonds at the interface, permitting the formation of Ga-Se bonds that help to passivate the underlying GaAs layer. Illumination also helps to reduce defects in the ZnSe epilayer. Furthermore, these results suggest that moderate UV illumination during growth may be used as a way to improve the optical properties of both the GaAs and ZnSe layers on either side of the interface.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- Grant/Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1378895
- Report Number(s):
- NREL/JA--5K00-68795
- Journal Information:
- Scientific Reports, Journal Name: Scientific Reports Journal Issue: 1 Vol. 7; ISSN 2045-2322
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Controlling ZnSe/GaAs interface properties: The role of elemental exposure and photon irradiation during growth initiation
|
journal | December 2018 |
Defects in C d 3 A s 2 epilayers via molecular beam epitaxy and strategies for reducing them
|
journal | December 2019 |
Similar Records
Controlling ZnSe/GaAs interface properties: The role of elemental exposure and photon irradiation during growth initiation
An x-ray photoelectron spectroscopy study of bonding at II-VI/III-V heterovalent interfaces
Effect of ZnSe/GaAs interface treatment in ZnSe quality control for optoelectronic device applications
Journal Article
·
Mon Dec 10 19:00:00 EST 2018
· Journal of Applied Physics
·
OSTI ID:1489328
An x-ray photoelectron spectroscopy study of bonding at II-VI/III-V heterovalent interfaces
Conference
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena; (United States)
·
OSTI ID:7115811
Effect of ZnSe/GaAs interface treatment in ZnSe quality control for optoelectronic device applications
Journal Article
·
Thu Jan 26 19:00:00 EST 2017
· Applied Surface Science
·
OSTI ID:1346813