Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Chen, Z.; Weyland, M.; Ercius, P.; Ciston, J.; Zheng, C.; Fuhrer, M. S.; D'Alfonso, A. J.; Allen, L. J.; Findlay, S. D.

doi:10.1016/j.ultramic.2016.06.009

Title: Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Journal Article · Sat Jun 25 00:00:00 EDT 2016 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2016.06.009· OSTI ID:1377511

Chen, Z. ^[1]; Weyland, M. ^[1]; Ercius, P. ^[2]; Ciston, J. ^[2]; Zheng, C. ^[1]; Fuhrer, M. S. ^[1]; D'Alfonso, A. J. ^[3]; Allen, L. J. ^[3]; Findlay, S. D. ^[1]

Monash University, Clayton, VIC (Australia)
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy, Molecular Foundry
University of Melbourne (Australia)

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a technique where a full two-dimensional convergent beam electron diffraction (CBED) pattern is acquired at every STEM pixel scanned. Capturing the full diffraction pattern provides a rich dataset that potentially contains more information about the specimen than is contained in conventional imaging modes using conventional integrating detectors. In this work, using 4D datasets in STEM from two specimens, monolayer MoS₂ and bulk SrTiO₃, we demonstrate multiple STEM imaging modes on a quantitative absolute intensity scale, including phase reconstruction of the transmission function via differential phase contrast imaging. Finally, practical issues about sampling (i.e. number of detector pixels), signal-to-noise enhancement and data reduction of large 4D-STEM datasets are emphasized.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1377511

Alternate ID(s):: OSTI ID: 1396446

Journal Information:: Ultramicroscopy, Vol. 169, Issue C; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 21 works

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