Fabrication and testing of antimony doped bismuth tri-iodide semiconductor gamma-ray detectors
Journal Article
·
· Radiation Measurements
- Univ. of Florida, Gainesville, FL (United States). Dept. of Materials Science and Engineering; University of Florida
- Univ. of Florida, Gainesville, FL (United States). Dept. of Materials Science and Engineering
We fabricated antimony (Sb) doped bismuth tri-iodide (BiI3) radiation detectors from large single crystals that were grown using the modified vertical Bridgman technique. Detectors were prepared by subjecting the crystal surfaces to different mechanical and chemical treatments. Surface quality of the detectors was evaluated using optical microscopy. The influence of surface quality on detector performance was analyzed by measuring the leakage current for each of the detectors. The radiation response of the detectors was measured using an Americium (241Am) gamma-ray source at room temperature. The first successful use of BiI3 detectors for gamma-ray spectroscopy is reported here with energy resolution of 7.5% at 59.5 keV. The mobility-lifetime product for electrons was also estimated to be about 5.2 x 10-4 cm2/V.
- Research Organization:
- Univ. of Michigan, Ann Arbor, MI (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- FG52-09NA29358; NA0002534
- OSTI ID:
- 1366760
- Alternate ID(s):
- OSTI ID: 1357832
- Journal Information:
- Radiation Measurements, Journal Name: Radiation Measurements Journal Issue: C Vol. 91; ISSN 1350-4487
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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