Imaging ZnO Nanobelts and Nanobelt-Supported Metal Nanocatalysts by Aberration-Corrected Scanning Transmission Electron Microscopy

Conference · Thu Jan 01 00:00:00 EST 2009

DOI:https://doi.org/10.1017/S1431927609098286· OSTI ID:1362176

Liu, Prof. Jimmy ^[1]; Allard, Jr, Lawrence Frederick ^[2]

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1. University of Missouri, St. Louis
2. ORNL

The development of aberration correctors and their routine applications in transmission and scanning transmission electron microscopy mode have enabled sub- ngstr m imaging of practical nanoscale materials and nanocatalysts. To correctly interpret the observed image contrast of practical samples is, however, still challenging. For example, the contrast of the various features in a high-angle annular dark-field (HA-ADF) image can be affected by many parameters such as sample tilt [1], presence of amorphous materials [2], overlapping crystallites, electron-beam channeling, etc. The visibility and image contrast of individual monomers, dimers or small clusters supported on relatively thick crystalline substrates may be modulated by tilting the substrate crystal away from electron-beam channeling conditions or the major zone axes.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). High Temperature Materials Lab. (HTML)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1362176
• Resource Relation: Journal Volume: 15; Journal Issue: S2; Conference: Microscopy Society of America, Richmond, VA, USA, 20090726, 20090730
• Country of Publication: United States
• Language: English

Related Subjects

ZnO nanobelts
nano-catalysts
aberration-corrected
electron microscopy
STEM