Performance and Image Analysis of the Aberration Corrected Hitachi HD-2700C Stem

Journal Article · Sun Mar 01 04:00:00 EST 2009 · Journal of Electron Microscopy

DOI:https://doi.org/10.1093/jmicro/dfp011· OSTI ID:1040244

Inada, H; Zhu, Y; Wu, L; Wall, J; Su, D

We report the performance of the first aberration-corrected scanning transmission electron microscope (STEM) manufactured by Hitachi. We describe its unique features and versatile capabilities in atomic-scale characterization and its applications in materials research. We also discuss contrast variation of the STEM images obtained from different annular dark-field (ADF) detectors of the instrument, and the increased complexity in contrast interpretation and quantification due to the increased convergent angles of the electron probe associated with the aberration corrector. We demonstrate that the intensity of atomic columns in an ADF image depends strongly on a variety of imaging parameters, sample thickness, as well as the nuclear charge and the deviation from their periodic position of the atoms we are probing. Image simulations are often required to correctly interpret the atomic structure of an ADF-STEM image.

• Research Organization: BROOKHAVEN NATIONAL LABORATORY (BNL)
• Sponsoring Organization: USDOE SC OFFICE OF SCIENCE (SC)
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 1040244
• Report Number(s): BNL--90287-2009-JA; KC0201010
• Journal Information: Journal of Electron Microscopy, Journal Name: Journal of Electron Microscopy Journal Issue: 3 Vol. 58; ISSN 0022-0744
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC NUMBER
ATOMS
ELECTRON MICROSCOPES
ELECTRON PROBES
PERFORMANCE
THICKNESS