Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS), Inst. for Functional Imaging of Materials
Polarization switching in ferroelectric and multiferroic materials underpins a broad range of current and emergent applications, ranging from random access memories to field-effect transistors, and tunnelling devices. Switching in these materials is exquisitely sensitive to local defects and microstructure on the nanometre scale, necessitating spatially resolved high-resolution studies of these phenomena. Classical piezoresponse force microscopy and spectroscopy, although providing necessary spatial resolution, are fundamentally limited in data acquisition rates and energy resolution. This limitation stems from their two-tiered measurement protocol that combines slow (~1 s) switching and fast (~10 kHz–1 MHz) detection waveforms. Here we develop an approach for rapid probing of ferroelectric switching using direct strain detection of material response to probe bias. This approach, facilitated by high-sensitivity electronics and adaptive filtering, enables spectroscopic imaging at a rate 3,504 times faster the current state of the art, achieving high-veracity imaging of polarization dynamics in complex microstructures.
Somnath, Suhas, et al. "Rapid mapping of polarization switching through complete information acquisition." Nature Communications, vol. 7, Dec. 2016. https://doi.org/10.1038/ncomms13290
Somnath, Suhas, Belianinov, Alex, Kalinin, Sergei V., & Jesse, Stephen (2016). Rapid mapping of polarization switching through complete information acquisition. Nature Communications, 7. https://doi.org/10.1038/ncomms13290
Somnath, Suhas, Belianinov, Alex, Kalinin, Sergei V., et al., "Rapid mapping of polarization switching through complete information acquisition," Nature Communications 7 (2016), https://doi.org/10.1038/ncomms13290
@article{osti_1334426,
author = {Somnath, Suhas and Belianinov, Alex and Kalinin, Sergei V. and Jesse, Stephen},
title = {Rapid mapping of polarization switching through complete information acquisition},
annote = {Polarization switching in ferroelectric and multiferroic materials underpins a broad range of current and emergent applications, ranging from random access memories to field-effect transistors, and tunnelling devices. Switching in these materials is exquisitely sensitive to local defects and microstructure on the nanometre scale, necessitating spatially resolved high-resolution studies of these phenomena. Classical piezoresponse force microscopy and spectroscopy, although providing necessary spatial resolution, are fundamentally limited in data acquisition rates and energy resolution. This limitation stems from their two-tiered measurement protocol that combines slow (~1 s) switching and fast (~10 kHz–1 MHz) detection waveforms. Here we develop an approach for rapid probing of ferroelectric switching using direct strain detection of material response to probe bias. This approach, facilitated by high-sensitivity electronics and adaptive filtering, enables spectroscopic imaging at a rate 3,504 times faster the current state of the art, achieving high-veracity imaging of polarization dynamics in complex microstructures.},
doi = {10.1038/ncomms13290},
url = {https://www.osti.gov/biblio/1334426},
journal = {Nature Communications},
issn = {ISSN 2041-1723},
volume = {7},
place = {United States},
publisher = {Nature Publishing Group},
year = {2016},
month = {12}}