Full information acquisition in piezoresponse force microscopy

Somnath, Suhas; Belianinov, Alexei; Jesse, Stephen

doi:10.1063/1.4938482

Full information acquisition in piezoresponse force microscopy

Journal Article · Mon Dec 28 04:00:00 EST 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4938482· OSTI ID:22486314

Somnath, Suhas; Belianinov, Alexei; Jesse, Stephen ^[1]

The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100–150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. The future prospects of full information imaging in scanning probe microscopy are discussed.

OSTI ID:: 22486314

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 26 Vol. 107; ISSN APPLAB; ISSN 0003-6951

Country of Publication:: United States

Language:: English

References (27)

Role of 90° domains in lead zirconate titanate thin films Ganpule, C. S.; Nagarajan, V.; Li, H. Applied Physics Letters, Vol. 77, Issue 2 https://doi.org/10.1063/1.126954	journal	July 2000
Electromechanics on the Nanometer Scale: Emerging Phenomena, Devices, and Applications Kalinin, Sergei V.; Setter, Nava; Kholkin, Andrei L. MRS Bulletin, Vol. 34, Issue 9 https://doi.org/10.1557/mrs2009.174	journal	September 2009
Ferroelectric domain switching dynamics with combined 20 nm and 10 ns resolution Polomoff, Nicholas A.; Premnath, Ramesh Nath; Bosse, James L. Journal of Materials Science, Vol. 44, Issue 19 https://doi.org/10.1007/s10853-009-3699-x	journal	October 2009
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy Gruverman, Alexei; Auciello, Orlando; Tokumoto, Hiroshi Annual Review of Materials Science, Vol. 28, Issue 1 https://doi.org/10.1146/annurev.matsci.28.1.101	journal	August 1998
Electromechanical probing of ionic currents in energy storage materials Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V. Applied Physics Letters, Vol. 96, Issue 22 https://doi.org/10.1063/1.3446838	journal	May 2010
Direct Mapping of Ionic Transport in a Si Anode on the Nanoscale: Time Domain Electrochemical Strain Spectroscopy Study Jesse, Stephen; Balke, Nina; Eliseev, Eugene ACS Nano, Vol. 5, Issue 12 https://doi.org/10.1021/nn203141g	journal	November 2011
Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy Kalinin, Sergei V.; Rodriguez, Brian J.; Jesse, Stephen Annual Review of Materials Research, Vol. 37, Issue 1 https://doi.org/10.1146/annurev.matsci.37.052506.084323	journal	August 2007
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images Bosman, M.; Watanabe, M.; Alexander, D. T. L. Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032 https://doi.org/10.1016/j.ultramic.2006.04.016	journal	October 2006
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Bonnell, D. A.; Kalinin, S. V.; Kholkin, A. L. MRS Bulletin, Vol. 34, Issue 9 https://doi.org/10.1557/mrs2009.176	journal	September 2009
Scanning Force Microscopy Studies of Domain Structure in B a T i O ₃ Single Crystals Gruverman, Alexei L.; Hatano, Jun; Tokumoto, Hiroshi Japanese Journal of Applied Physics, Vol. 36, Issue Part 1, No. 4A https://doi.org/10.1143/jjap.36.2207	journal	April 1997
A Decade of Piezoresponse Force Microscopy: Progress, Challenges and Opportunities Kalinin, Sergei V.; Rar, Andrei; Jesse, Stephen arXiv https://doi.org/10.48550/arxiv.cond-mat/0509009	text	January 2005
Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution Balke, Nina; Jesse, Stephen; Kim, Yoongu Nano Letters, Vol. 10, Issue 9 https://doi.org/10.1021/nl101439x	journal	September 2010
A decade of piezoresponse force microscopy: progress, challenges, and opportunities Kalinin, Sergei; Rar, Andrei; Jesse, Stephen IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Vol. 53, Issue 12 https://doi.org/10.1109/tuffc.2006.169	journal	December 2006
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger Nanotechnology, Vol. 18, Issue 43 https://doi.org/10.1088/0957-4484/18/43/435503	journal	September 2007
Complete information acquisition in dynamic force microscopy Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms7550	journal	March 2015
Electromechanical Probing of Ionic Currents in Energy Storage Materials Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V. arXiv https://doi.org/10.48550/arxiv.1002.0961	text	January 2010
Molecular ferroelectrics: where electronics meet biology Li, Jiangyu; Liu, Yuanming; Zhang, Yanhang Physical Chemistry Chemical Physics, Vol. 15, Issue 48 https://doi.org/10.1039/c3cp52501e	journal	January 2013
Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future Balke, Nina; Bdikin, Igor; Kalinin, Sergei V. Journal of the American Ceramic Society, Vol. 92, Issue 8 https://doi.org/10.1111/j.1551-2916.2009.03240.x	journal	August 2009
Contact resonances in voltage-modulated force microscopy Harnagea, C.; Alexe, M.; Hesse, D. Applied Physics Letters, Vol. 83, Issue 2 https://doi.org/10.1063/1.1592307	journal	July 2003
Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control Gruverman, A.; Auciello, O.; Ramesh, R. Nanotechnology, Vol. 8, Issue 3A https://doi.org/10.1088/0957-4484/8/3a/008	journal	September 1997
High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging Nath, Ramesh; Chu, Ying-Hao; Polomoff, Nicholas A. Applied Physics Letters, Vol. 93, Issue 7, Article No. 072905 https://doi.org/10.1063/1.2969045	journal	August 2008
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
Band excitation in scanning probe microscopy: sines of change Jesse, Stephen; Kalinin, Sergei V. Journal of Physics D: Applied Physics, Vol. 44, Issue 46 https://doi.org/10.1088/0022-3727/44/46/464006	journal	November 2011
Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy Jesse, S.; Guo, S.; Kumar, A. Nanotechnology, Vol. 21, Issue 40 https://doi.org/10.1088/0957-4484/21/40/405703	journal	September 2010
Dual-frequency resonance-tracking atomic force microscopy Rodriguez, Brian J.; Callahan, Clint; Kalinin, Sergei V. Nanotechnology, Vol. 18, Issue 47, Article No. 475504 https://doi.org/10.1088/0957-4484/18/47/475504	journal	October 2007
Multivariate statistical methods for the analysis of microscope image series: applications in materials science Bonnet, N. Journal of Microscopy, Vol. 190, Issue 1‐2 https://doi.org/10.1046/j.1365-2818.1998.3250876.x	journal	April 1998
Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors Dehoff, C.; Rodriguez, B. J.; Kingon, A. I. Review of Scientific Instruments, Vol. 76, Issue 2 https://doi.org/10.1063/1.1850652	journal	February 2005

Cited By (13)

Deep neural networks for understanding noisy data applied to physical property extraction in scanning probe microscopy Borodinov, Nikolay; Neumayer, Sabine; Kalinin, Sergei V. npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0148-5	journal	February 2019
Rapid mapping of polarization switching through complete information acquisition Somnath, Suhas; Belianinov, Alex; Kalinin, Sergei V. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms13290	journal	December 2016
Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imaging Borodinov, Nikolay; Belianinov, Alex; Chang, Dongsook Nanoscale, Vol. 10, Issue 37 https://doi.org/10.1039/c8nr05630g	journal	January 2018
Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography Jesse, S.; Chi, M.; Belianinov, A. Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep26348	journal	May 2016
Application of pan-sharpening algorithm for correlative multimodal imaging using AFM-IR Borodinov, Nikolay; Bilkey, Natasha; Foston, Marcus npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0186-z	journal	April 2019
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space Collins, Liam; Belianinov, Alex; Somnath, Suhas Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep30557	journal	August 2016
Revealing ferroelectric switching character using deep recurrent neural networks Agar, Joshua C.; Naul, Brett; Pandya, Shishir Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-12750-0	journal	October 2019
Frontiers in strain-engineered multifunctional ferroic materials Agar, Joshua C.; Pandya, Shishir; Xu, Ruijuan MRS Communications, Vol. 6, Issue 3 https://doi.org/10.1557/mrc.2016.29	journal	August 2016
Automated Interpretation and Extraction of Topographic Information from Time of Flight Secondary Ion Mass Spectrometry Data Ievlev, Anton V.; Belianinov, Alexei; Jesse, Stephen Scientific Reports, Vol. 7, Issue 1 https://doi.org/10.1038/s41598-017-17049-y	journal	December 2017
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics Collins, Liam; Belianinov, Alex; Proksch, Roger Applied Physics Letters, Vol. 108, Issue 19 https://doi.org/10.1063/1.4948601	journal	May 2016
Materials science in the artificial intelligence age: high-throughput library generation, machine learning, and a pathway from correlations to the underpinning physics Vasudevan, Rama K.; Choudhary, Kamal; Mehta, Apurva MRS Communications, Vol. 9, Issue 3 https://doi.org/10.1557/mrc.2019.95	journal	July 2019
Tutorial: Product properties in multiferroic nanocomposites Viehland, Dwight; Li, Jie Fang; Yang, Yaodong Journal of Applied Physics, Vol. 124, Issue 6 https://doi.org/10.1063/1.5038726	journal	August 2018

Similar Records

Full information acquisition in piezoresponse force microscopy

Journal Article · Sun Dec 27 19:00:00 EST 2015 · Applied Physics Letters · OSTI ID:1235834

Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

Journal Article · Sun Jun 19 20:00:00 EDT 2016 · Applied Physics Letters · OSTI ID:1259425

High Frequency Piezoresponse Force Microscopy in the 1-8 MHz Regime

Journal Article · Sun Dec 31 23:00:00 EST 2006 · Applied Physics Letters · OSTI ID:992086

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DETECTION
EXCITATION
INFORMATION THEORY
MICROSCOPY
NONLINEAR PROBLEMS
RESONANCE
SURFACES

Full information acquisition in piezoresponse force microscopy

Citation Formats

References (27)

Cited By (13)

Similar Records

Related Subjects