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Reliable High-Performance Gate Oxides for Wide Band Gap Devices.

Conference ·
OSTI ID:1323048
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Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Electricity Delivery and Energy Reliability (OE)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1323048
Report Number(s):
SAND2015-7534C; 603477
Country of Publication:
United States
Language:
English

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