Reliable High-Performance Gate Oxides for Wide Band Gap Devices.
Conference
·
OSTI ID:1114585
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1114585
- Report Number(s):
- SAND2013-8721C; 476964
- Country of Publication:
- United States
- Language:
- English
Similar Records
Reliable High-Performance Gate Oxides for Wide Band Gap Devices.
Reliable High-Performance Gate Oxides for Wide Band Gap Devices.
Reliable High-Performance Gate Oxides for Wide Band Gap Devices.
Conference
·
Tue Sep 01 00:00:00 EDT 2015
·
OSTI ID:1325523
Reliable High-Performance Gate Oxides for Wide Band Gap Devices.
Conference
·
Tue Sep 01 00:00:00 EDT 2015
·
OSTI ID:1323048
Reliable High-Performance Gate Oxides for Wide Band Gap Devices.
Conference
·
Thu Sep 01 00:00:00 EDT 2016
·
OSTI ID:1395615