Reliable High-Performance Gate Oxides for Wide Band Gap Devices.

Conference · Tue Oct 01 00:00:00 EDT 2013

OSTI ID:1114585

Ihlefeld, Jon.; Atcitty, Stanley; Brumbach, Michael T; DasGupta, Sandeepan; Maria, Jon-Paul

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1114585
• Report Number(s): SAND2013-8721C; 476964
• Resource Relation: Conference: Proposed for presentation at the DOE Office of Electricity and Energy Storage Peer Review held October 21-25, 2013 in San Diego, CA.
• Country of Publication: United States
• Language: English