Preface to Special Topic: Piezoresponse Force Microscopy
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
- Georgia Inst. of Technology, Atlanta, GA (United States)
- Univ. of Geneva (Switzerland)
Almost two decades beyond the inception of piezoresponse force microscopy (PFM) and the seminal papers by G€uthner and Dransfeld1 and Gruverman et al., the technique has become the prevailing approach for nanoscale functional characterization of polar materials and has been extended to the probing of other electromechanical effects through the advent of electrochemical strain microscopy (ESM). This focus issue celebrates some of the recent advances in the field and offers a wider outlook of polar materials and their overall characterization. In this paper, we cover topics that include discussions of the properties of traditional ferroelectrics, such as lead zirconate titanate (PZT) and lithium niobate, relaxorferroelectrics, as well as more “exotic” ferroelectric oxides such as hafnia, ferroelectric biological matter, and multiferroic materials. Technique-oriented contributions include papers on the coupling of PFM with other characterization methods such as x-ray diffraction (XRD) and superconducting quantum interface device (SQUID), in addition to considerations on the open questions on the electromechanical response in biased scanning probe microscopy (SPM) techniques, including the effects of the laser spot placement on the readout cantilever displacement, the influence of the tip on the creation of the domain shapes, and the impact of ionic and electronic dynamics on the observed nanoscale hysteretic phenomena.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); National Science Foundation (NSF)
- Grant/Contract Number:
- AC05-00OR22725; DMR-1255379
- OSTI ID:
- 1311252
- Alternate ID(s):
- OSTI ID: 1229625
- Journal Information:
- Journal of Applied Physics, Vol. 118, Issue 7; ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Local poling of ferroelectric polymers by scanning force microscopy
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journal | August 1992 |
Micro- and nanodomain imaging in uniaxial ferroelectrics: Joint application of optical, confocal Raman, and piezoelectric force microscopy
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journal | August 2014 |
Decoupling Electrochemical Reaction and Diffusion Processes in Ionically-Conductive Solids on the Nanometer Scale
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journal | November 2010 |
Grain size and domain size relations in bulk ceramic ferroelectric materials
|
journal | October 1996 |
Nanoscale Control of Ferroelectric Domain Structure by AFM
|
journal | January 1994 |
Ferroelectric or non-ferroelectric: Why so many materials exhibit “ferroelectricity” on the nanoscale
|
journal | June 2017 |
| Ferroelectric or non-ferroelectric: why so many materials exhibit ferroelectricity on the nanoscale | preprint | January 2017 |
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