Electrostatically-blind quantitative piezoresponse force microscopy free of distributed-force artifacts

Killgore, Jason P.; Robins, Larry; Collins, Liam

doi:10.1039/D2NA00046F

Title: Electrostatically-blind quantitative piezoresponse force microscopy free of distributed-force artifacts

Journal Article · Tue Apr 12 00:00:00 EDT 2022 · Nanoscale Advances

DOI:https://doi.org/10.1039/D2NA00046F· OSTI ID:1860263

^[1]; Robins, Larry ^[1]; Collins, Liam ^[2]

Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, USA
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA

The presence of electrostatic forces and associated artifacts complicates the interpretation of piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). Eliminating these artifacts provides an opportunity for precisely mapping domain wall structures and dynamics, accurately quantifying local piezoelectric coupling coefficients, and reliably investigating hysteretic processes at the single nanometer scale to determine properties and mechanisms which underly important applications including computing, batteries and biology. Here we exploit the existence of an electrostatic blind spot (ESBS) along the length of the cantilever, due to the distributed nature of the electrostatic force, which can be universally used to separate unwanted long range electrostatic contributions from short range electromechanical responses of interest. The results of ESBS-PFM are compared to state-of-the-art interferometric displacement sensing PFM, showing excellent agreement above their respective noise floors. Ultimately, ESBS-PFM allows for absolute quantification of piezoelectric coupling coefficients independent of probe, lab or experimental conditions. As such, we expect the widespread adoption of EBSB-PFM to be a paradigm shift in the quantification of nanoscale electromechanics.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1860263

Alternate ID(s):: OSTI ID: 1883968

Journal Information:: Nanoscale Advances, Journal Name: Nanoscale Advances Vol. 4 Journal Issue: 8; ISSN 2516-0230

Publisher:: Royal Society of Chemistry (RSC)Copyright Statement

Country of Publication:: United Kingdom

Language:: English

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