Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Pennycook, Timothy J.; Lupini, Andrew R.; Yang, Hao; Murfitt, Matthew F.; Jones, Lewys; Nellist, Peter D.

doi:10.1016/j.ultramic.2014.09.013

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Journal Article · Wed Oct 15 00:00:00 EDT 2014 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2014.09.013· OSTI ID:1265595

^[1]; Lupini, Andrew R. ^[2]; Yang, Hao ^[3]; Murfitt, Matthew F. ^[4]; Jones, Lewys ^[3]; Nellist, Peter D. ^[1]

Daresbury Lab. (United Kingdom). EPSRC SuperSTEM Facility; Univ. of Oxford (United Kingdom). Dept. of Materials
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Materials Science and Technology Division
Univ. of Oxford (United Kingdom). Dept. of Materials
Nion Co., Kirkland, WA (United States)

In this paper, we demonstrate a method to achieve high efficiency phase contrast imaging in aberration corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The pixelated detector is used to record the Ronchigram as a function of probe position which is then analyzed with ptychography. Ptychography has previously been used to provide super-resolution beyond the diffraction limit of the optics, alongside numerically correcting for spherical aberration. Here we rely on a hardware aberration corrector to eliminate aberrations, but use the pixelated detector data set to utilize the largest possible volume of Fourier space to create high efficiency phase contrast images. The use of ptychography to diagnose the effects of chromatic aberration is also demonstrated. In conclusion, the four dimensional dataset is used to compare different bright field detector configurations from the same scan for a sample of bilayer graphene. Our method of high efficiency ptychography produces the clearest images, while annular bright field produces almost no contrast for an in-focus aberration-corrected probe.

View Accepted Manuscript (DOE)

Research Organization:: Daresbury Lab. (United Kingdom); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: Engineering and Physical Sciences Research Council (EPSRC) (United Kingdom); European Union (EU); USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Contributing Organization:: Univ. of Oxford (United Kingdom)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1265595

Alternate ID(s):: OSTI ID: 22468394
OSTI ID: 1247889

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Vol. 151; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
47 OTHER INSTRUMENTATION
ABF
Chromatic aberrations
DPC
Phase contrast
Pixelated detectors
Ptycography
STEM

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

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