Talbot-Lau X-ray Deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments

Journal Article · Thu Apr 21 00:00:00 EDT 2016 · IEEE Transactions on Plasma Science

DOI:https://doi.org/10.1109/TPS.2016.2552038· OSTI ID:1258592

Valdivia, M. P. ^[1]; Stutman, D. ^[1]; Stoeckl, C. ^[2]; Mileham, C. ^[2]; Begishev, I. ^[2]; Theobald, W. ^[2]; Bromage, J. ^[2]; Regan, S. P. ^[2]; Klein, S. R. ^[3]; Munoz-Cordoves, G. ^[4]; Vescovi, M. ^[4]; Valenzuela-Villaseca, V. ^[4]; Veloso, F. ^[4]

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1. Johns Hopkins Univ., Baltimore, MD (United States)
2. Univ. of Rochester, Rochester, NY (United States)
3. Univ. of Michigan, Ann Arbor, MI (United States)
4. Pontificia Univ. Catolica de Chile, Santiago (Chile)

Talbot-Lau X-ray Deflectometry has been developed as an electron density diagnostic for High Energy Density plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping was demonstrated for 25-29 J, 8-30 ps laser pulses using copper foil targets. Moire pattern formation and grating survival was also observed using a copper x-pinch driven at 400 kA, ~1 kA/ns. Lastly, these results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.

• Research Organization: Johns Hopkins Univ., Baltimore, MD (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• Grant/Contract Number: NA0002955
• OSTI ID: 1258592
• Journal Information: IEEE Transactions on Plasma Science, Journal Name: IEEE Transactions on Plasma Science; ISSN 0093-3813
• Publisher: IEEE
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
X-ray imaging
refraction diagnostics
High-energy (HED) diagnostic