A study of light point defect removal by SC-1 chemistries
Recent research has shown that dilute SC-1 chemistries, when combined with high frequency sonication (megasonics) can be highly effective for particle removal. The mechanism by which the SC-1 chemistry facilitates particle removal remains unclear. Experiments were performed under extremely dilute conditions in order to help elucidate a cleaning mechanism. Results indicate that hydrogen peroxide, under extremely dilute conditions, is not necessary for effective particle removal. The increase in haze commonly attributed to increased surface roughness is not observed when sufficiently dilute ammonium hydroxide (e.g., 1:2700) is used. The role of hydrogen peroxide, when more concentrated chemistries are used, may be simply to mitigate surface etching and roughening, rather than to play an active role in particle removal.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 125006
- Report Number(s):
- SAND--95-2380C; CONF-951007--7; ON: DE96002077
- Country of Publication:
- United States
- Language:
- English
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