Magnetic properties of epitaxial and polycrystalline Fe/Si multilayers

Conference · Tue Aug 01 04:00:00 EDT 1995

OSTI ID:123242

Chaiken, A; Michel, R P ^[1]; Wang, C T ^[2]

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1. Lawrence Livermore National Lab., CA (United States)
2. Stanford Univ., Palo Alto, CA (United States)

Fe/Si multilayers with antiferromagnetic interlayer coupling have been grown via ion-beam sputtering on both glass and single-crystal substrates. X-ray diffraction measurements show that both sets of films have crystalline iron silicide spacer layers and a periodic composition modulation. Films grown on glass have smaller crystallite sizes than those grown on single-crystal substrates and have a significant remanent magnetization. Films grown on single-crystal substrates have a smaller remanence. The observation of magnetocrystalline anisotropy in hysteresis loops and (hkl) peaks in x-ray diffraction demonstrates that the films grown on MgO and Ge are epitaxial. The smaller remanent magnetization in Fe/Si multilayers with better crystallinity suggests that the remanence is not intrinsic.

• Research Organization: Lawrence Livermore National Lab., CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 123242
• Report Number(s): UCRL-JC--121930; CONF-951101--5; ON: DE96001969
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
ANISOTROPY
CRYSTAL GROWTH
FILMS
GERMANIUM
IRON
IRON SILICIDES
LAYERS
MAGNESIUM OXIDES
MAGNETIC PROPERTIES
MAGNETIZATION
SILICON
SURFACE COATING
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION