High pressure Laue diffraction and its application to study microstructural changes during the α → β phase transition in Si
- Carnegie Inst. of Washington, Argonne, IL (United States). High Pressure Collaborative Access Team (HPCAT)
Here, an approach using polychromatic x-ray Laue diffraction is described for studying pressure induced microstructural changes of materials under pressure. The advantages of this approach with respect to application of monochromatic x-ray diffraction and other techniques are discussed. Experiments to demonstrate the applications of the method have been performed on the α → β phase transition in Si at high pressures using a diamond anvil cell. We present the characterization of microstructures across the α–β phase transition, such as morphology of both the parent and product phases, relative orientation of single-crystals, and deviatoric strains. Subtle inhomogeneous strain of the single-crystal sample caused by lattice rotations becomes detectable with the approach.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA); National Science Foundation (NSF)
- Grant/Contract Number:
- NA0001974; FG02-99ER45775; AC02-06CH11357
- OSTI ID:
- 1203736
- Alternate ID(s):
- OSTI ID: 1228683
- Journal Information:
- Review of Scientific Instruments, Vol. 86, Issue 7; ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- ENGLISH
Web of Science
Real time study of grain enlargement in zirconium under room-temperature compression across the α to ω phase transition
|
journal | October 2019 |
Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments
|
journal | February 2019 |
High-pressure studies with x-rays using diamond anvil cells
|
journal | November 2016 |
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