Soft x-ray free-electron laser induced damage to inorganic scintillators

Burian, Tomáš; Hájková, Věra; Chalupský, Jaromír; Vyšín, Luděk; Boháček, Pavel; Přeček, Martin; Wild, Jan; Özkan, Cigdem; Coppola, Nicola; Farahani, Shafagh Dastjani; Schulz, Joachim; Sinn, Harald; Tschentscher, Thomas; Gaudin, Jérôme; Bajt, Saša; Tiedtke, Kai; Toleikis, Sven; Chapman, Henry N.; Loch, Rolf A.; Jurek, Marek; Sobierajski, Ryszard; Krzywinski, Jacek; Moeller, Stefan; Harmand, Marion; Galasso, Germano; Nagasono, Mitsuru; Saskl, Karel; Sovák, Pavol; Juha, Libor

doi:10.1364/OME.5.000254

Soft x-ray free-electron laser induced damage to inorganic scintillators

Journal Article · Tue Jan 06 23:00:00 EST 2015 · Optical Materials Express

DOI:https://doi.org/10.1364/OME.5.000254· OSTI ID:1223351

Burian, Tomáš ^[1]; Hájková, Věra ^[2]; Chalupský, Jaromír ^[2]; Vyšín, Luděk ^[2]; Boháček, Pavel ^[2]; Přeček, Martin ^[2]; Wild, Jan ^[3]; Özkan, Cigdem ^[4]; Coppola, Nicola ^[5]; Farahani, Shafagh Dastjani ^[5]; Schulz, Joachim ^[6]; Sinn, Harald ^[5]; Tschentscher, Thomas ^[5]; Gaudin, Jérôme ^[7]; Bajt, Saša ^[8]; Tiedtke, Kai ^[8]; Toleikis, Sven ^[8]; Chapman, Henry N. ^[9]; Loch, Rolf A. ^[10]; Jurek, Marek ^[11] more »

Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic). Inst. of Physics; Charles Univ. (Czech Republic)
Academy of Sciences of the Czech Republic (ASCR), Prague (Czech Republic). Inst. of Physics
Charles Univ. (Czech Republic)
Paul Scherrer Inst. (PSI), Villigen (Switzerland); European XFEL CmbH, Hamburg (Germany)
European XFEL CmbH, Hamburg (Germany)
European XFEL CmbH, Hamburg (Germany); Center for Free-Electron Laser Science, Hamburg (Germany)
Univ. Bordeaux (France)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Center for Free-Electron Laser Science, Hamburg (Germany); Univ. of Hamburg (Germany)
Center for Free-Electron Laser Science, Hamburg (Germany); FOM Inst. DIFFER (The Netherlands)
Polish Academy of Sciences (PAS), Warsaw (Poland)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Inst. de minéralogie, Paris (France)
Technische Univ. Wien (Germany)
RIKEN, Hyogo (Japan)
Slovak Academy of Sciences (Slovak Republic)
P. J. Šafárik Univ. (Slovak Republic)

An irreversible response of inorganic scintillators to intense soft x-ray laser radiation was investigated at the FLASH (Free-electron LASer in Hamburg) facility. Three ionic crystals, namely, Ce:YAG (cerium-doped yttrium aluminum garnet), PbWO4 (lead tungstate), and ZnO (zinc oxide), were exposed to single 4.6 nm ultra-short laser pulses of variable pulse energy (up to 12 μJ) under normal incidence conditions with tight focus. Damaged areas produced with various levels of pulse fluences, were analyzed on the surface of irradiated samples using differential interference contrast (DIC) and atomic force microscopy (AFM). The effective beam area of 22.2 ± 2.2 μm2 was determined by means of the ablation imprints method with the use of poly(methyl methacrylate) - PMMA. Applied to the three inorganic materials, this procedure gave almost the same values of an effective area. The single-shot damage threshold fluence was determined for each of these inorganic materials. The Ce:YAG sample seems to be the most radiation resistant under the given irradiation conditions, its damage threshold was determined to be as high as 660.8 ± 71.2 mJ/cm2. Contrary to that, the PbWO4 sample exhibited the lowest radiation resistance with a threshold fluence of 62.6 ± 11.9 mJ/cm2. The threshold for ZnO was found to be 167.8 ± 30.8 mJ/cm2. Both interaction and material characteristics responsible for the damage threshold difference are discussed in the article.

View Accepted Manuscript (DOE)

Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC)

OSTI ID:: 1223351

Journal Information:: Optical Materials Express, Journal Name: Optical Materials Express Journal Issue: 2 Vol. 5; ISSN 2159-3930

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited By (2)

Saturation of a Ce:Y_3Al_5O_12 scintillator response to ultra-short pulses of extreme ultraviolet soft X-ray and X-ray laser radiation Krzywinski, J.; Andrejczuk, A.; Bionta, R. M. Optical Materials Express, Vol. 7, Issue 3 https://doi.org/10.1364/ome.7.000665	journal	January 2017
Saturation of a Ce:Y$_{3}$Al$_{5}$O$_{12}$ scintillator response to ultra-short pulses of extreme ultraviolet soft X-ray and X-ray laser radiation Krzywinski, J.; Andrejczuk, A.; Bionta, R. M. Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-00266	text	January 2017

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