Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser

Hau-Riege, S. P.; London, R. A.; Graf, A.; Baker, S. L.; Soufli, R.; Sobierajski, R.; Burian, T.; Chalupsky, J.; Juha, L.; Gaudin, J.; Krzywinski, J.; Moeller, S.; Messerschmidt, M.; Bozek, J.; Bostedt, C.

doi:10.1364/oe.18.023933

Title: Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser

Journal Article · Fri Oct 29 00:00:00 EDT 2010 · Optics Express

DOI:https://doi.org/10.1364/oe.18.023933· OSTI ID:1672142

Hau-Riege, S. P. ^[1]; London, R. A. ^[1]; Graf, A. ^[1]; Baker, S. L. ^[1]; Soufli, R. ^[1]; Sobierajski, R. ^[2]; Burian, T. ^[3]; Chalupsky, J. ^[4]; Juha, L. ^[3]; Gaudin, J. ^[5]; Krzywinski, J. ^[6]; Moeller, S. ^[6]; Messerschmidt, M. ^[6]; Bozek, J. ^[6]; Bostedt, C. ^[6]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Polish Academy of Sciences (PAS), Krakow (Poland); Foundation for Fundamental Research on Matter (FOM), Nieuwegein (The Netherlands)
Academy of Sciences of the Czech Republic, Prague (Czech Republic)
Academy of Sciences of the Czech Republic, Prague (Czech Republic); Czech Technical Univ. in Prague (Czech Republic)
European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
SLAC National Accelerator Lab., Menlo Park, CA (United States)

Materials used for hard x-ray-free-electron laser (XFEL) optics must withstand high-intensity x-ray pulses. The advent of the Linac Coherent Light Source has enabled us to expose candidate optical materials, such as bulk B₄C and SiC films, to 0.83 keV XFEL pulses with pulse energies between 1 μJ and 2 mJ to determine short-pulse hard x-ray damage thresholds. The fluence required for the onset of damage for single pulses is around the melt fluence and slightly lower for multiple pulses. We observed strong mechanical cracking in the materials, which may be due to the larger penetration depths of the hard x-rays.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Foundation for Fundamental Research on Matter (FOM); Nederlandse Organisatie voor Wetenschappelijk Onderzoek (NWO); Ministry of Science and Higher Education; Czech Ministry of Education; Academy of Sciences of the Czech Republic

Grant/Contract Number:: AC02-76SF00515; AC52-07NA27344; LC510; LC528; LA08024; ME10046; Z10100523; IAA400100701; IAAX00100903; KAN300100702

OSTI ID:: 1672142

Journal Information:: Optics Express, Vol. 18, Issue 23; ISSN 1094-4087

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

References (13)

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Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser Hau-Riege, Stefan P.; London, Richard A.; Bionta, Richard M. Applied Physics Letters, Vol. 93, Issue 20 https://doi.org/10.1063/1.3021081	journal	November 2008
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Near-Ultraviolet Luminescence of $N_{2}$ Irradiated by Short X-Ray Pulses Hau-Riege, Stefan P.; Bionta, Richard M.; Ryutov, Dmitri D. Physical Review Letters, Vol. 105, Issue 4 https://doi.org/10.1103/PhysRevLett.105.043003	journal	July 2010
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Linac Coherent Light Source soft x-ray materials science instrument optical design and monochromator commissioning Heimann, Philip; Krupin, Oleg; Schlotter, William F. Review of Scientific Instruments, Vol. 82, Issue 9 https://doi.org/10.1063/1.3633947	journal	September 2011
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Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser Milov, Igor; Makhotkin, Igor A.; Sobierajski, Ryszard Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-03672	text	January 2018
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Femtosecond X-ray induced changes of the electronic and magnetic response of solids from electron redistribution Higley, Daniel J.; Reid, Alex H.; Chen, Zhao Nature Communications, Vol. 10, Issue 1 https://doi.org/10.1038/s41467-019-13272-5	journal	November 2019
X-ray induced damage of B$_4$C-coated bilayer materials under various irradiation conditions Follath, Rolf; Koyama, Takahisa; Lipp, Vladimir Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-01181	text	January 2019
Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction Lee, Heemin; Shin, Jaeyong; Cho, Do Hyung Journal of Synchrotron Radiation, Vol. 27, Issue 1 https://doi.org/10.1107/s1600577519015443	journal	January 2020
X-ray induced damage of B$_4$C-coated bilayer materials under various irradiation conditions Ziaja, Beata; Follath, Rolf; Koyama, Takashisa Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-00032	text	January 2019
Damage threshold of coating materials on x-ray mirror for x-ray free electron laser Koyama, Takahisa; Yumoto, Hirokatsu; Miura, Takanori Review of Scientific Instruments, Vol. 87, Issue 5 https://doi.org/10.1063/1.4950723	journal	May 2016

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