Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser

Hau-Riege, S. P.; London, R. A.; Graf, A.; Baker, S. L.; Soufli, R.; Sobierajski, R.; Burian, T.; Chalupsky, J.; Juha, L.; Gaudin, J.; Krzywinski, J.; Moeller, S.; Messerschmidt, M.; Bozek, J.; Bostedt, C.

doi:10.1364/oe.18.023933

Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser

Journal Article · Fri Oct 29 00:00:00 EDT 2010 · Optics Express

DOI:https://doi.org/10.1364/oe.18.023933· OSTI ID:1672142

Hau-Riege, S. P. ^[1]; London, R. A. ^[2]; Graf, A. ^[2]; Baker, S. L. ^[2]; Soufli, R. ^[2]; Sobierajski, R. ^[3]; Burian, T. ^[4]; Chalupsky, J. ^[5]; Juha, L. ^[4]; Gaudin, J. ^[6]; Krzywinski, J. ^[7]; Moeller, S. ^[7]; Messerschmidt, M. ^[7]; Bozek, J. ^[7]; Bostedt, C. ^[7]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); SLAC
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Polish Academy of Sciences (PAS), Krakow (Poland); Foundation for Fundamental Research on Matter (FOM), Nieuwegein (The Netherlands)
Academy of Sciences of the Czech Republic, Prague (Czech Republic)
Academy of Sciences of the Czech Republic, Prague (Czech Republic); Czech Technical Univ. in Prague (Czech Republic)
European X-ray Free-Electron Laser (XFEL), Hamburg (Germany)
SLAC National Accelerator Lab., Menlo Park, CA (United States)

Materials used for hard x-ray-free-electron laser (XFEL) optics must withstand high-intensity x-ray pulses. The advent of the Linac Coherent Light Source has enabled us to expose candidate optical materials, such as bulk B₄C and SiC films, to 0.83 keV XFEL pulses with pulse energies between 1 μJ and 2 mJ to determine short-pulse hard x-ray damage thresholds. The fluence required for the onset of damage for single pulses is around the melt fluence and slightly lower for multiple pulses. We observed strong mechanical cracking in the materials, which may be due to the larger penetration depths of the hard x-rays.

Research Organization:: SLAC National Accelerator Laboratory, Menlo Park, CA (United States). Linac Coherent Light Source (LCLS); Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); Foundation for Fundamental Research on Matter (FOM); Nederlandse Organisatie voor Wetenschappelijk Onderzoek (NWO); Ministry of Science and Higher Education; Czech Ministry of Education; Academy of Sciences of the Czech Republic

Grant/Contract Number:: AC02-76SF00515; AC52-07NA27344

OSTI ID:: 1672142

Journal Information:: Optics Express, Journal Name: Optics Express Journal Issue: 23 Vol. 18; ISSN 1094-4087

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

References (13)

X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 Henke, B. L.; Gullikson, E. M.; Davis, J. C. Atomic Data and Nuclear Data Tables, Vol. 54, Issue 2, p. 181-342 https://doi.org/10.1006/adnd.1993.1013	journal	July 1993
Unified model of secondary electron cascades in diamond Ziaja, Beata; London, Richard A.; Hajdu, Janos Journal of Applied Physics, Vol. 97, Issue 6 https://doi.org/10.1063/1.1853494	journal	March 2005
Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5nm wavelength Hau-Riege, S. P.; London, R. A.; Bionta, R. M. Applied Physics Letters, Vol. 90, Issue 17 https://doi.org/10.1063/1.2734366	journal	April 2007
Measurement of x-ray free-electron-laser pulse energies by photoluminescence in nitrogen gas Hau–Riege, S. P.; Bionta, R. M.; Ryutov, D. D. Journal of Applied Physics, Vol. 103, Issue 5 https://doi.org/10.1063/1.2844478	journal	March 2008
Multiple pulse thermal damage thresholds of materials for x-ray free electron laser optics investigated with an ultraviolet laser Hau-Riege, Stefan P.; London, Richard A.; Bionta, Richard M. Applied Physics Letters, Vol. 93, Issue 20 https://doi.org/10.1063/1.3021081	journal	November 2008
Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle Chalupský, J.; Hájková, V.; Altapova, V. Applied Physics Letters, Vol. 95, Issue 3 https://doi.org/10.1063/1.3184785	journal	July 2009
Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation Hau-Riege, S. P.; London, R. A.; Bionta, R. M. Applied Physics Letters, Vol. 95, Issue 11 https://doi.org/10.1063/1.3216845	journal	September 2009
The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations Tiedtke, K.; Azima, A.; von Bargen, N. New Journal of Physics, Vol. 11, Issue 2 https://doi.org/10.1088/1367-2630/11/2/023029	journal	February 2009
Soft-x-ray free-electron-laser interaction with materials Hau-Riege, Stefan P.; London, Richard A.; Chapman, Henry N. Physical Review E, Vol. 76, Issue 4 https://doi.org/10.1103/PhysRevE.76.046403	journal	October 2007
Measurements and Simulations of Ultralow Emittance and Ultrashort Electron Beams in the Linac Coherent Light Source Ding, Y.; Brachmann, A.; Decker, F. -J. Physical Review Letters, Vol. 102, Issue 25 https://doi.org/10.1103/PhysRevLett.102.254801	journal	June 2009
Near-Ultraviolet Luminescence of N 2 Irradiated by Short X-Ray Pulses Hau-Riege, Stefan P.; Bionta, Richard M.; Ryutov, Dmitri D. Physical Review Letters, Vol. 105, Issue 4 https://doi.org/10.1103/PhysRevLett.105.043003	journal	July 2010
Morphology, microstructure, stress and damage properties of thin film coatings for the LCLS x-ray mirrors Soufli, Regina; Baker, Sherry L.; Robinson, Jeff C. SPIE Europe Optics + Optoelectronics, SPIE Proceedings https://doi.org/10.1117/12.823836	conference	May 2009
Simple technique for measurements of pulsed Gaussian-beam spot sizes Liu, J. M. Optics Letters, Vol. 7, Issue 5 https://doi.org/10.1364/OL.7.000196	journal	January 1982

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Ablation and transmission of thin solid targets irradiated by intense extreme ultraviolet laser radiation Aslanyan, V.; Kuznetsov, I.; Bravo, H. APL Photonics, Vol. 1, Issue 6 https://doi.org/10.1063/1.4953669	journal	September 2016
Preparation and characterization of B ₄ C coatings for advanced research light sources Störmer, Michael; Siewert, Frank; Sinn, Harald Journal of Synchrotron Radiation, Vol. 23, Issue 1 https://doi.org/10.1107/s1600577515020901	journal	January 2016
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Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser Milov, Igor; Makhotkin, Igor A.; Sobierajski, Ryszard Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2018-03672	text	January 2018
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X-ray induced damage of B$_4$C-coated bilayer materials under various irradiation conditions Ziaja, Beata; Follath, Rolf; Koyama, Takashisa Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-00032	text	January 2019
X-ray induced damage of B$_4$C-coated bilayer materials under various irradiation conditions Follath, Rolf; Koyama, Takahisa; Lipp, Vladimir Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-01181	text	January 2019

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36 MATERIALS SCIENCE
Optical materials
X-ray free electron laser
X-ray optics

Interaction of short x-ray pulses with low-Z x-ray optics materials at the LCLS free-electron laser

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References (13)

Cited By (13)

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