Frontiers of in situ electron microscopy
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Univ. of California-San Diego, San Diego, CA (United States)
In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the correlation between structure and properties of materials. With the recent advances in instrumentation, including aberration corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more and more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is included. It also provides an introduction to the six articles covered by in this issue of MRS Bulletin explore the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, nanomechanics, ferroelectric domain switching studied by in situ TEM, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
- OSTI ID:
- 1193214
- Report Number(s):
- BNL--108005-2015-JA; KC0201010
- Journal Information:
- MRS Bulletin, Journal Name: MRS Bulletin Journal Issue: 01 Vol. 40; ISSN 0883-7694
- Publisher:
- Materials Research SocietyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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