Perspectives on in situ electron microscopy

Zheng, Haimei; Zhu, Yimei

doi:10.1016/j.ultramic.2017.03.022

Perspectives on in situ electron microscopy

Journal Article · Wed Mar 29 00:00:00 EDT 2017 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2017.03.022· OSTI ID:1376186

Zheng, Haimei ^[1]; Zhu, Yimei ^[2]

Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Materials Sciences Division; Univ. of California, Berkeley, CA (United States). Dept. of Materials Science and Engineering
Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Condensed Matter Physics and Materials Science; Stony Brook Univ., NY (United States). Dept. of Physics and Astronomy

In situ transmission electron microscopy (TEM) with the ability to reveal materials dynamic processes with high spatial and temporal resolution has attracted significant interest. The recent advances in in situ methods, including liquid and gas sample environment, pump-probe ultrafast microscopy, nanomechanics and ferroelectric domain switching the aberration corrected electron optics as well as fast electron detector has opened new opportunities to extend the impact of in situ TEM in broad areas of research ranging from materials science to chemistry, physics and biology. Here in this paper, we highlight the development of liquid environment electron microscopy and its applications in the study of colloidal nanoparticle growth, electrochemical processes and others; in situ study of topological vortices in ferroelectric and ferromagnetic materials. At the end, perspectives of future in situ TEM are provided.

View Accepted Manuscript (DOE)

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: SC0012704

OSTI ID:: 1376186

Alternate ID(s):: OSTI ID: 1550480
OSTI ID: 22741450

Report Number(s):: BNL--114172-2017-JA; KC0201010

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Journal Issue: C Vol. 180; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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