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Title: Perspectives on in situ electron microscopy

Abstract

In situ transmission electron microscopy (TEM) with the ability to reveal materials dynamic processes with high spatial and temporal resolution has attracted significant interest. The recent advances in in situ methods, including liquid and gas sample environment, pump-probe ultrafast microscopy, nanomechanics and ferroelectric domain switching the aberration corrected electron optics as well as fast electron detector has opened new opportunities to extend the impact of in situ TEM in broad areas of research ranging from materials science to chemistry, physics and biology. Here in this paper, we highlight the development of liquid environment electron microscopy and its applications in the study of colloidal nanoparticle growth, electrochemical processes and others; in situ study of topological vortices in ferroelectric and ferromagnetic materials. At the end, perspectives of future in situ TEM are provided.

Authors:
 [1];  [2]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Materials Sciences Division; Univ. of California, Berkeley, CA (United States). Dept. of Materials Science and Engineering
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Condensed Matter Physics and Materials Science; Stony Brook Univ., NY (United States). Dept. of Physics and Astronomy
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1376186
Report Number(s):
BNL-114172-2017-JA
Journal ID: ISSN 0304-3991; R&D Project: MA015MACA; KC0201010
Grant/Contract Number:  
SC0012704
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 180; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; In situ TEM; Liquid cell TEM; Aberration correction; Colloidal nanocrystal growth; Ferroelectric vortices; Ferromagnetic domains switching

Citation Formats

Zheng, Haimei, and Zhu, Yimei. Perspectives on in situ electron microscopy. United States: N. p., 2017. Web. doi:10.1016/j.ultramic.2017.03.022.
Zheng, Haimei, & Zhu, Yimei. Perspectives on in situ electron microscopy. United States. doi:10.1016/j.ultramic.2017.03.022.
Zheng, Haimei, and Zhu, Yimei. Wed . "Perspectives on in situ electron microscopy". United States. doi:10.1016/j.ultramic.2017.03.022. https://www.osti.gov/servlets/purl/1376186.
@article{osti_1376186,
title = {Perspectives on in situ electron microscopy},
author = {Zheng, Haimei and Zhu, Yimei},
abstractNote = {In situ transmission electron microscopy (TEM) with the ability to reveal materials dynamic processes with high spatial and temporal resolution has attracted significant interest. The recent advances in in situ methods, including liquid and gas sample environment, pump-probe ultrafast microscopy, nanomechanics and ferroelectric domain switching the aberration corrected electron optics as well as fast electron detector has opened new opportunities to extend the impact of in situ TEM in broad areas of research ranging from materials science to chemistry, physics and biology. Here in this paper, we highlight the development of liquid environment electron microscopy and its applications in the study of colloidal nanoparticle growth, electrochemical processes and others; in situ study of topological vortices in ferroelectric and ferromagnetic materials. At the end, perspectives of future in situ TEM are provided.},
doi = {10.1016/j.ultramic.2017.03.022},
journal = {Ultramicroscopy},
number = C,
volume = 180,
place = {United States},
year = {Wed Mar 29 00:00:00 EDT 2017},
month = {Wed Mar 29 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 1 work
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