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Title: Process for fabricating a microelectromechanical structure

Patent ·
OSTI ID:1175096

A process is disclosed for forming a microelectromechanical (MEM) structure on a substrate having from 5 to 6 or more layers of deposited and patterned polysilicon. The process is based on determining a radius of curvature of the substrate which is bowed due to accumulated stress in the layers of polysilicon and a sacrificial material used to buildup the MEM structure, and then providing one or more stress-compensation layers on a backside of the substrate to flatten the substrate and allow further processing.

Research Organization:
Sandia National Lab. (SNL-CA), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation
Patent Number(s):
6,808,952
Application Number:
10/236,631
OSTI ID:
1175096
Country of Publication:
United States
Language:
English

References (1)

Improved polysilicon surface-micromachined micromirror devices using chemical-mechanical polishing
  • Hetherington, Dale L.; Sniegowski, Jeffry J.
  • SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, SPIE Proceedings https://doi.org/10.1117/12.326692
conference October 1998