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Electrostatic MEMS devices with high reliability

Patent ·
OSTI ID:1170735
The present invention provides for an electrostatic microelectromechanical (MEMS) device comprising a dielectric layer separating a first conductor and a second conductor. The first conductor is moveable towards the second conductor, when a voltage is applied to the MEMS device. The dielectric layer recovers from dielectric charging failure almost immediately upon removal of the voltage from the MEMS device.
Research Organization:
Univ. of Wisconsin, Madison, WI (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-02ER46016
Assignee:
Goldsmith,Charles L. (Plano, TX)
Patent Number(s):
8,963,659
Application Number:
13/114,945
OSTI ID:
1170735
Country of Publication:
United States
Language:
English

References (5)

Performance of low-loss RF MEMS capacitive switches journal January 1998
Acceleration of Dielectric Charging in RF MEMS Capacitive Switches journal January 2006
Micromechanical membrane switches for microwave applications conference January 1995
Temperature Acceleration of Dielectric Charging in RF MEMS Capacitive Switches conference June 2006
Characteristics of micromachined switches at microwave frequencies conference January 1996

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