Scaling Trends in SET Pulse Widths in Sub-100 nm Bulk CMOS Processes.
Conference
·
OSTI ID:1124414
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1124414
- Report Number(s):
- SAND2010-0721C; 493164
- Country of Publication:
- United States
- Language:
- English
Similar Records
Scaling trends in SET pulse widths in Sub-100 nm bulk CMOS processes.
The effect of layout topology on single-event transient pulse quenching in a 65 nm bulk CMOS process.
A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS.
Conference
·
Thu Jul 01 00:00:00 EDT 2010
·
OSTI ID:1021643
The effect of layout topology on single-event transient pulse quenching in a 65 nm bulk CMOS process.
Conference
·
Thu Jul 01 00:00:00 EDT 2010
·
OSTI ID:1021623
A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS.
Conference
·
Mon Nov 01 00:00:00 EDT 2021
·
OSTI ID:1899521