The Effect of Neutron Energy on Single Event Upsets and Multiple Bit Upsets.
Conference
·
OSTI ID:1109332
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1109332
- Report Number(s):
- SAND2011-0958C; 471375
- Country of Publication:
- United States
- Language:
- English
Similar Records
The size effect of ion charge tracks on single event multiple-bit upset
Multiple-bit upset in 103 nm CMOS technology.
Single event upset mechanisms for low energy deposition events in silicon germanium HBTs.
Conference
·
Mon Nov 30 23:00:00 EST 1987
· IEEE Trans. Nucl. Sci.; (United States)
·
OSTI ID:5098517
Multiple-bit upset in 103 nm CMOS technology.
Conference
·
Sat Jul 01 00:00:00 EDT 2006
·
OSTI ID:892773
Single event upset mechanisms for low energy deposition events in silicon germanium HBTs.
Conference
·
Sat Jul 01 00:00:00 EDT 2006
·
OSTI ID:893559