skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: The Effect of Neutron Energy on Single Event Upsets and Multiple Bit Upsets.

Conference ·
OSTI ID:1109332

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1109332
Report Number(s):
SAND2011-0958C; 471375
Resource Relation:
Conference: Proposed for presentation at the 2011 IEEE Nuclear & Space Radiation Effects Conf. held July 25-29, 2011 in Las Vegas, NV.
Country of Publication:
United States
Language:
English

Similar Records

The size effect of ion charge tracks on single event multiple-bit upset
Conference · Tue Dec 01 00:00:00 EST 1987 · IEEE Trans. Nucl. Sci.; (United States) · OSTI ID:1109332

Experimental and analytical investigation of single event, multiple bit upsets in poly-silicon load, 64K x 1 NMOS SRAMs
Conference · Thu Dec 01 00:00:00 EST 1988 · IEEE Trans. Nucl. Sci.; (United States) · OSTI ID:1109332

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits.
Conference · Sun Apr 01 00:00:00 EDT 2007 · OSTI ID:1109332

Related Subjects