Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

Thalakulam, Madhu; Simmons, C. B.; Van Bael, B. J.; Rosemeyer, B. M.; Savage, D. E.; Lagally, M. G.; Friesen, Mark; Coppersmith, S. N.; Eriksson, M. A.

doi:10.1103/PhysRevB.84.045307

Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

Journal Article · Mon Jul 11 00:00:00 EDT 2011 · Physical Review B

DOI:https://doi.org/10.1103/PhysRevB.84.045307· OSTI ID:1099758

Thalakulam, Madhu; Simmons, C. B.; Van Bael, B. J.; Rosemeyer, B. M.; Savage, D. E.; Lagally, M. G.; Friesen, Mark; Coppersmith, S. N.; Eriksson, M. A.

Not Available

Sponsoring Organization:: USDOE

OSTI ID:: 1099758

Journal Information:: Physical Review B, Journal Name: Physical Review B Journal Issue: 4 Vol. 84; ISSN 1098-0121; ISSN PRBMDO

Publisher:: American Physical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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