Single-Shot Measurement and Tunnel-Rate Spectroscopy of a Si/SiGe One-Electron Quantum Dot.

Thalakulam, Madhu; Simmons, C. B.; Rosemeyer, B. M.; Savage, D. E.; Friesen, Mark; Coppersmith, S. N.; Eriksson, M. A.; Van Bael, B. J.; Lagally, M. G.

Single-Shot Measurement and Tunnel-Rate Spectroscopy of a Si/SiGe One-Electron Quantum Dot.

Journal Article · Wed Sep 01 04:00:00 EDT 2010 · Nano Letters

OSTI ID:1141701

Thalakulam, Madhu; Simmons, C. B.; Rosemeyer, B. M.; Savage, D. E.; Friesen, Mark; Coppersmith, S. N.; Eriksson, M. A.; Van Bael, B. J.; Lagally, M. G.

Abstract not provided.

Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1141701

Report Number(s):: SAND2010-6323J; 506420

Journal Information:: Nano Letters, Journal Name: Nano Letters

Country of Publication:: United States

Language:: English

Similar Records

Single-shot measurement and tunnel-rate spectroscopy of a Si/SiGe few-electron quantum dot

Journal Article · Sun Jul 10 20:00:00 EDT 2011 · Physical Review B · OSTI ID:1099758

Charge Sensing Spectroscopy in Si/SiGe Quantum Dots.

Conference · Sun Aug 01 00:00:00 EDT 2010 · OSTI ID:1692323

Transport through an impurity tunnel coupled to a Si/SiGe quantum dot.

Conference · Mon Feb 29 23:00:00 EST 2016 · OSTI ID:1346497

Single-Shot Measurement and Tunnel-Rate Spectroscopy of a Si/SiGe One-Electron Quantum Dot.

Citation Formats

Similar Records

Related Subjects