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Thermally Evaporated Iron (Oxide) on an Alumina Barrier Layer, by XPS

Journal Article · · Surface Science Spectra, 20(1):Article No. 49
DOI:https://doi.org/10.1116/11.20121104· OSTI ID:1094926
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We report the XPS characterization of a thermally evaporated iron thin film (6 nm) deposited on an Si/SiO_2/Al_2O_3 substrate using Al Ka X-rays. An XPS survey spectrum, narrow Fe 2p scan, narrow O 1s, and valence band scan are shown.
Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
1094926
Report Number(s):
PNNL-SA-95243; 34739; KP1704020
Journal Information:
Surface Science Spectra, 20(1):Article No. 49, Journal Name: Surface Science Spectra, 20(1):Article No. 49
Country of Publication:
United States
Language:
English

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