Thermally Annealed Iron (Oxide) Thin Film on an Alumina Barrier Layer, by XPS

Journal Article · Fri Sep 06 04:00:00 EDT 2013 · Surface Science Spectra, 20(1):Article No. 55

DOI:https://doi.org/10.1116/11.20121105· OSTI ID:1094925

Madaan, Nitesh; Kanyal, Supriya S.; Jensen, David S.; Vail, Michael A.; Dadson, Andrew; Engelhard, Mark H.; Linford, Matthew R.

Herein we show characterization of an Fe thin film on Al_2O_3 after thermal annealing under H_2 using Al Ka X-rays. The XPS survey spectrum, narrow Fe 2p scan, and valence band regions are presented. The survey spectrum shows aluminum signals due to exposure of the underlying Al_2O_3 film during Fe nanoparticle formation.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RL01830
• OSTI ID: 1094925
• Report Number(s): PNNL-SA-95255; 34739; KP1704020
• Journal Information: Surface Science Spectra, 20(1):Article No. 55, Journal Name: Surface Science Spectra, 20(1):Article No. 55
• Country of Publication: United States
• Language: English

Related Subjects

Environmental Molecular Sciences Laboratory