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Title: The Feynman-Y Statistic in Relation to Shift-Register Neutron Coincidence Counting: Precision and Dead Time

Conference ·
OSTI ID:1046507

The Feynman-Y statistic is a type of autocorrelation analysis. It is defined as the excess variance-to-mean ratio, Y = VMR - 1, of the number count distribution formed by sampling a pulse train using a series of non-overlapping gates. It is a measure of the degree of correlation present on the pulse train with Y = 0 for Poisson data. In the context of neutron coincidence counting we show that the same information can be obtained from the accidentals histogram acquired using the multiplicity shift-register method, which is currently the common autocorrelation technique applied in nuclear safeguards. In the case of multiplicity shift register analysis however, overlapping gates, either triggered by the incoming pulse stream or by a periodic clock, are used. The overlap introduces additional covariance but does not alter the expectation values. In this paper we discuss, for a particular data set, the relative merit of the Feynman and shift-register methods in terms of both precision and dead time correction. Traditionally the Feynman approach is applied with a relatively long gate width compared to the dieaway time. The main reason for this is so that the gate utilization factor can be taken as unity rather than being treated as a system parameter to be determined at characterization/calibration. But because the random trigger interval gate utilization factor is slow to saturate this procedure requires a gate width many times the effective 1/e dieaway time. In the traditional approach this limits the number of gates that can be fitted into a given assay duration. We empirically show that much shorter gates, similar in width to those used in traditional shift register analysis can be used. Because the way in which the correlated information present on the pulse train is extracted is different for the moments based method of Feynman and the various shift register based approaches, the dead time losses are manifested differently for these two approaches. The resulting estimates for the dead time corrected first and second order reduced factorial moments should be independent of the method however and this allows the respective dead time formalism to be checked. We discuss how to make dead time corrections in both the shift register and the Feynman approaches.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
DOE/LANL
DOE Contract Number:
AC52-06NA25396
OSTI ID:
1046507
Report Number(s):
LA-UR-12-22976; TRN: US1203778
Resource Relation:
Conference: 53rd Annual INMM Meeting ; 2012-07-16 - 2012-07-19 ; Orlando, Florida, United States
Country of Publication:
United States
Language:
English

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