Long Range Interactions in Nanoscale Science
Journal Article
·
· Reviews of Modern Physics
more »
- DuPont Company
- National Institutes of Health
- Massachusetts Institute of Technology (MIT)
- Lehigh University, Bethlehem, PA
- Clemson University
- Johns Hopkins University
- University of Illinois, Urbana-Champaign
- ORNL
- University of Gothenburg, Sweden
- Rutgers University
- Yale University
- University of Missouri
- Imperial College, London
- AZ Electronic Materials Corporation, USA
- Sandia National Laboratories (SNL)
- University of Buffalo, The State University of New York
- Institut de Chimie de la Matiere Condensee de Bordeaux, France
Our understanding of the long range electrodynamic, electrostatic, and polar interactions that dominate the organization of small objects at separations beyond an interatomic bond length is reviewed. From this basic-forces perspective, a large number of systems are described from which one can learn about these organizing forces and how to modulate them. The many practical systems that harness these nanoscale forces are then surveyed. The survey reveals not only the promise of new devices and materials, but also the possibility of designing them more effectively.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1045870
- Journal Information:
- Reviews of Modern Physics, Journal Name: Reviews of Modern Physics Vol. 82; ISSN 0034-6861; ISSN RMPHAT
- Country of Publication:
- United States
- Language:
- English
Similar Records
Light-driven nanoscale vectorial currents
Nanoscale polarization transient gratings
Ultrafast nanoscale imaging of surface charges by scanning resistive probe microscopy.
Journal Article
·
Tue Feb 06 23:00:00 EST 2024
· Nature (London)
·
OSTI ID:2332791
Nanoscale polarization transient gratings
Journal Article
·
Sun Dec 29 23:00:00 EST 2024
· Nature Communications
·
OSTI ID:2491390
Ultrafast nanoscale imaging of surface charges by scanning resistive probe microscopy.
Journal Article
·
Fri Dec 31 23:00:00 EST 2010
· Nano Letters
·
OSTI ID:1035453