Ultrafast nanoscale imaging of surface charges by scanning resistive probe microscopy.

Journal Article · Sat Jan 01 04:00:00 EST 2011 · Nano Letters

DOI:https://doi.org/10.1021/nl103372a· OSTI ID:1035453

Ko, H; Ryu, K; Park, H; Park, C; Jeon, D; Kim, Y K; Jung, J; Min, D-K; Kim, Y; Lee, H N; Park, Y; Shin, H; Hong, S ^[1]

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1. Materials Science Division

Nanoscale manipulation of surface charges and their imaging are essential for understanding local electronic behaviors of polar materials and advanced electronic devices. Electrostatic force microscopy and Kelvin probe force microscopy have been extensively used to probe and image local surface charges responsible for electrodynamics and transport phenomena. However, they rely on the weak electric force modulation of cantilever that limits both spatial and temporal resolutions. Here we present a field effect transistor embedded probe that can directly image surface charges on a length scale of 25 nm and a time scale of less than 125 {mu}s. On the basis of the calculation of net surface charges in a 25 nm diameter ferroelectric domain, we could estimate the charge density resolution to be as low as 0.08 {mu}C/cm{sup 2}, which is equivalent to 1/20 electron per nanometer square at room temperature.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: SC; Samsung Electronic, Inc.
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1035453
• Report Number(s): ANL/MSD/JA-66112
• Journal Information: Nano Letters, Journal Name: Nano Letters Journal Issue: 4 Vol. 11; ISSN 1530-6984
• Country of Publication: United States
• Language: ENGLISH

Related Subjects

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
CHARGE DENSITY
ELECTRODYNAMICS
ELECTRONS
ELECTROSTATICS
FIELD EFFECT TRANSISTORS
MICROSCOPY
MODULATION
PROBES
RESOLUTION
TRANSPORT