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Title: Performance and Image Analysis of the Aberration Corrected Hitachi HD-2700C Stem

Abstract

We report the performance of the first aberration-corrected scanning transmission electron microscope (STEM) manufactured by Hitachi. We describe its unique features and versatile capabilities in atomic-scale characterization and its applications in materials research. We also discuss contrast variation of the STEM images obtained from different annular dark-field (ADF) detectors of the instrument, and the increased complexity in contrast interpretation and quantification due to the increased convergent angles of the electron probe associated with the aberration corrector. We demonstrate that the intensity of atomic columns in an ADF image depends strongly on a variety of imaging parameters, sample thickness, as well as the nuclear charge and the deviation from their periodic position of the atoms we are probing. Image simulations are often required to correctly interpret the atomic structure of an ADF-STEM image.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE SC OFFICE OF SCIENCE (SC)
OSTI Identifier:
1040244
Report Number(s):
BNL-90287-2009-JA
Journal ID: ISSN 0022-0744; R&D Project: MA-015-MACA; KC0201010; TRN: US201210%%425
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Journal of Electron Microscopy
Additional Journal Information:
Journal Volume: 58; Journal Issue: 3; Journal ID: ISSN 0022-0744
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC NUMBER; ATOMS; ELECTRON MICROSCOPES; ELECTRON PROBES; PERFORMANCE; THICKNESS

Citation Formats

Inada, H, Zhu, Y, Wu, L, Wall, J, and Su, D. Performance and Image Analysis of the Aberration Corrected Hitachi HD-2700C Stem. United States: N. p., 2009. Web. doi:10.1093/jmicro/dfp011.
Inada, H, Zhu, Y, Wu, L, Wall, J, & Su, D. Performance and Image Analysis of the Aberration Corrected Hitachi HD-2700C Stem. United States. https://doi.org/10.1093/jmicro/dfp011
Inada, H, Zhu, Y, Wu, L, Wall, J, and Su, D. 2009. "Performance and Image Analysis of the Aberration Corrected Hitachi HD-2700C Stem". United States. https://doi.org/10.1093/jmicro/dfp011.
@article{osti_1040244,
title = {Performance and Image Analysis of the Aberration Corrected Hitachi HD-2700C Stem},
author = {Inada, H and Zhu, Y and Wu, L and Wall, J and Su, D},
abstractNote = {We report the performance of the first aberration-corrected scanning transmission electron microscope (STEM) manufactured by Hitachi. We describe its unique features and versatile capabilities in atomic-scale characterization and its applications in materials research. We also discuss contrast variation of the STEM images obtained from different annular dark-field (ADF) detectors of the instrument, and the increased complexity in contrast interpretation and quantification due to the increased convergent angles of the electron probe associated with the aberration corrector. We demonstrate that the intensity of atomic columns in an ADF image depends strongly on a variety of imaging parameters, sample thickness, as well as the nuclear charge and the deviation from their periodic position of the atoms we are probing. Image simulations are often required to correctly interpret the atomic structure of an ADF-STEM image.},
doi = {10.1093/jmicro/dfp011},
url = {https://www.osti.gov/biblio/1040244}, journal = {Journal of Electron Microscopy},
issn = {0022-0744},
number = 3,
volume = 58,
place = {United States},
year = {2009},
month = {3}
}