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CALIBRATION OF X-RAY IMAGING DEVICES FOR ACCURATE INTENSITY MEASUREMENT

Conference ·
National Security Technologies (NSTec) has developed calibration procedures for X-ray imaging systems. The X-ray sources that are used for calibration are both diode type and diode/fluorescer combinations. Calibrating the X-ray detectors is key to accurate calibration of the X-ray sources. Both energy dispersive detectors and photodiodes measuring total flux were used. We have developed calibration techniques for the detectors using radioactive sources that are traceable to the National Institute of Standards and Technology (NIST). The German synchrotron at Physikalische Technische Bundestalt (PTB) is used to calibrate silicon photodiodes over the energy range from 50 eV to 60 keV. The measurements on X-ray cameras made using the NSTec X-ray sources have included quantum efficiency averaged over all pixels, camera counts per photon per pixel, and response variation across the sensor. The instrumentation required to accomplish the calibrations is described. X-ray energies ranged from 720 eV to 22.7 keV. The X-ray sources produce narrow energy bands, allowing us to determine the properties as a function of X-ray energy. The calibrations were done for several types of imaging devices. There were back illuminated and front illuminated CCD (charge coupled device) sensors, and a CID (charge injection device) type camera. The CCD and CID camera types differ significantly in some of their properties that affect the accuracy of X-ray intensity measurements. All cameras discussed here are silicon based. The measurements of quantum efficiency variation with X-ray energy are compared to models for the sensor structure. Cameras that are not back-thinned are compared to those that are.
Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
Sponsoring Organization:
USDOE
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
1035957
Report Number(s):
LLNL-CONF-530551
Country of Publication:
United States
Language:
English

References (6)

Imaging of laser–plasma x-ray emission with charge-injection devices journal January 2001
Electron-hole pair ionization energy in CdTe between 85 °K and 350 °K journal November 1970
Characterization of a charge-coupled-device detector in the 1100–014-nm (1-eV to 9-keV) spectral region journal January 1999
High-energy x-ray backlighter spectrum measurements using calibrated image plates journal February 2011
Large format CID x-ray image sensors conference April 1998
The PTB high-accuracy spectral responsivity scale in the VUV and x-ray range journal March 2006

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