CALIBRATION OF X-RAY IMAGING DEVICES FOR ACCURATE INTENSITY MEASUREMENT
National Security Technologies (NSTec) has developed calibration procedures for X-ray imaging systems. The X-ray sources that are used for calibration are both diode type and diode/fluorescer combinations. Calibrating the X-ray detectors is key to accurate calibration of the X-ray sources. Both energy dispersive detectors and photodiodes measuring total flux were used. We have developed calibration techniques for the detectors using radioactive sources that are traceable to the National Institute of Standards and Technology (NIST). The German synchrotron at Physikalische Technische Bundestalt (PTB) is used to calibrate silicon photodiodes over the energy range from 50 eV to 60 keV. The measurements on X-ray cameras made using the NSTec X-ray sources have included quantum efficiency averaged over all pixels, camera counts per photon per pixel, and response variation across the sensor. The instrumentation required to accomplish the calibrations is described. X-ray energies ranged from 720 eV to 22.7 keV. The X-ray sources produce narrow energy bands, allowing us to determine the properties as a function of X-ray energy. The calibrations were done for several types of imaging devices. There were back illuminated and front illuminated CCD (charge coupled device) sensors, and a CID (charge injection device) type camera. The CCD and CID camera types differ significantly in some of their properties that affect the accuracy of X-ray intensity measurements. All cameras discussed here are silicon based. The measurements of quantum efficiency variation with X-ray energy are compared to models for the sensor structure. Cameras that are not back-thinned are compared to those that are.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 1035957
- Report Number(s):
- LLNL-CONF-530551; TRN: US1201271
- Resource Relation:
- Journal Volume: 27; Journal Issue: 2; Conference: Presented at: Denver X-Ray Conference, Denver, CO, United States, Aug 01 - Aug 05, 2011
- Country of Publication:
- United States
- Language:
- English
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