Effect of Proton and Silicon Ion Irradiation on Defect Formation in GaAs
Journal Article
·
· IEEE Transactions on Nuclear Science
Electrical and structural changes in GaAs are monitored using electron beam induced current (EBIC) and transmission electron microscopy (TEM) measurements after irradiation by protons and silicon ions. It has been determined that higher energy protons (E ges 10 MeV) and silicon ions disordered regions that are electrically and structurally different than those produced by lower energy protons. The data suggest that these disordered regions are responsible for causing the deviations between experimental data and NIEL. From analyses of the recoil spectra, high energy recoils appear to be responsible for the formation of these disordered regions.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO.
- Sponsoring Organization:
- USDOE Office of Solar Energy Technologies Program
- DOE Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1023065
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6, December 2008 Vol. 55; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
Similar Records
Displacement Damage Evolution in GaAs Following Electron, Proton and Silicon Ion Irradiation
Radiation defects in p-type silicon irradiated with 30 MeV protons
Investigation of selected electrically active defects in polycrystalline silicon solar cell materials: Final subcontract report, 30 May 1986
Journal Article
·
Fri Nov 30 23:00:00 EST 2007
· IEEE Transactions on Nuclear Science
·
OSTI ID:1344745
Radiation defects in p-type silicon irradiated with 30 MeV protons
Journal Article
·
Mon Oct 31 23:00:00 EST 1977
· Sov. Phys. - Semicond. (Engl. Transl.); (United States)
·
OSTI ID:5055289
Investigation of selected electrically active defects in polycrystalline silicon solar cell materials: Final subcontract report, 30 May 1986
Technical Report
·
Sat Feb 28 23:00:00 EST 1987
·
OSTI ID:6889508