Electronic Structure of the Organic Semiconductor Copper Tetraphenylporphyrin (CuTPP)
The electronic structure of thin films of the organic semiconductor copper tetraphenylporphyrin (CuTPP) has been studied using synchrotron radiation-excited resonant soft X-ray emission spectroscopy (RSXE), near edge X-ray absorption fine structure (NEXAFS) spectroscopy, and X-ray photoemission spectroscopy (XPS). The C and N partial density of states for both the valence and conduction band electronic structure has been determined, while XPS was used to provide information on the chemical composition and the oxidation states of the copper. Good agreement was found between the experimental measurements of the valence and conduction bands and the results of density functional theory calculations.
- Research Organization:
- Brookhaven National Laboratory (BNL) National Synchrotron Light Source
- Sponsoring Organization:
- DOE - OFFICE OF SCIENCE
- DOE Contract Number:
- AC02-98CH10886
- OSTI ID:
- 1019721
- Report Number(s):
- BNL--95567-2011-JA
- Journal Information:
- Applied Surface Science, Journal Name: Applied Surface Science Journal Issue: 3 Vol. 256; ISSN ASUSEE; ISSN 0169-4332
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ABSORPTION SPECTROSCOPY
CHEMICAL COMPOSITION
COPPER
ELECTRONIC STRUCTURE
EMISSION SPECTROSCOPY
FINE STRUCTURE
FUNCTIONALS
ORGANIC SEMICONDUCTORS
PHOTOEMISSION
SPECTROSCOPY
SYNCHROTRONS
THIN FILMS
VALENCE
X-RAY PHOTOELECTRON SPECTROSCOPY
national synchrotron light source