Electronic Structure in Thin Film Organic Semiconductors Studied using Soft X-ray Emission and Resonant Inelastic X-ray Scattering

Journal Article · Sat Dec 31 23:00:00 EST 2005 · Thin Solid Films

DOI:https://doi.org/10.1016/j.tsf.2005.12.221· OSTI ID:930101

Zhang, Y; Downes, J; Wang, S; Learmonth, T; Plucinski, L; Matsuura, A; McGuinness, C; Glans, P; Bernardis, S

The electronic structure of thin films of the organic semiconductors copper and vanadyl (VO) phthalocyanine (Pc) has been measured using resonant soft X-ray emission spectroscopy and resonant inelastic X-ray scattering. For Cu-Pc we report the observation of two discrete states near E{sub F}. This differs from published photoemission results, but is in excellent agreement with density functional calculations. For VO-Pc, the vanadyl species is shown to be highly localized. Both dipole forbidden V 3d to V 3d*, and O 2p to V 3d* charge transfer transitions are observed, and explained in a local molecular orbital model.

• Research Organization: Brookhaven National Laboratory (BNL) National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: AC02-98CH10886
• OSTI ID: 930101
• Report Number(s): BNL--80739-2008-JA
• Journal Information: Thin Solid Films, Journal Name: Thin Solid Films Vol. 515; ISSN THSFAP; ISSN 0040-6090
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
AGREEMENTS
ATOMIC MODELS
CHARGES
COPPER
DENSITY
DIPOLES
ELECTRONIC STRUCTURE
EMISSION
EMISSION SPECTROSCOPY
FUNCTIONALS
MOLECULES
ORGANIC SEMICONDUCTORS
PHOTOEMISSION
PHTHALOCYANINES
SCATTERING
THIN FILMS
national synchrotron light source