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Interlaboratory verification of neutron spectra used for the testing of electronic parts

Conference ·
OSTI ID:10187722
;  [1]; ;  [2];  [3];  [4]
  1. Sandia National Labs., Albuquerque, NM (United States)
  2. Pennsylvania State Univ., University Park, PA (United States). Radiation Science and Engineering Center
  3. Utah Univ., Salt Lake City, UT (United States). Dept. of Mechanical Engineering
  4. Nuclear Radiation Center, McClellan AFB, CA (United States)

A methodology has been developed for verifying that a neutron energy spectrum measured for an environment correctly predicts the bulk displacement damage that would be observed in a silicon electronic device. The technique makes use of a package of silicon bipolar transistors (2N2222A), monitor activation foils (such as sulfur pellets), and thermoluminescence detectors (TLDs) that is placed in the test environment. The TLDs and monitors are then used to correct for the gamma-induced damage and to scale the reactor power in the test irradiation to that predicted by the neutron spectrum which is being verified. The damage predicted from the spectrum and the measured damage are then compared. In cases where the sensor set does not have sufficient sensitivity coverage to satisfactorily define the spectrum, the transistors can be used as spectrum sensors to provide sensitivity in the crucial energy region between 0.1 and 2.0 MeV. This results in the loss of the independent verification, but leads in a much higher fidelity spectrum. The technique greatly facilitates inter- and intralaboratory comparisons of effects testing and spectrum determinations.

Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
10187722
Report Number(s):
SAND--92-2482C; CONF-930809--6; ON: DE93040757
Country of Publication:
United States
Language:
English