Application of Z-contrast imaging to obtain column-by-column spectroscopic analysis of materials

Conference · Fri Jan 01 04:00:00 EST 1993

OSTI ID:10162752

Browning, N D; Pennycook, S J

Z-contrast imaging has been shown to be an effective method for obtaining a high-resolution image from a scanning transmission electron microscope (STEM). The incoherent nature of the high-angle scattering makes image interpretation straightforward and intuitive with the resolution limited only by the 2.2 {Angstrom} electron probe. The optimum experimental conditions for Z-contrast imaging also coincide with those used for analytical microscopy, enabling microanalysis to be performed with the same spatial resolution as the image. The detection limits afforded by a parallel detection system for electron energy loss spectroscopy (EELS) allows column-by-column core-loss spectroscopy to be performed using the Z-contrast image to position the electron probe. Preliminary results from the study of YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} illustrate the spatial resolution available with this technique and the potential applications for materials science.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States); Oak Ridge Inst. for Science and Education, TN (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 10162752
• Report Number(s): CONF-921101--125; ON: DE93015333
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400101
ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
BARIUM OXIDES
CHEMICAL ANALYSIS
COPPER OXIDES
ELECTRON PROBES
ENERGY-LOSS SPECTROSCOPY
HIGH-TC SUPERCONDUCTORS
IMAGES
MICROANALYSIS
STRUCTURE AND PHASE STUDIES
TRANSMISSION ELECTRON MICROSCOPY
USES
YTTRIUM OXIDES