Atomic-scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the STEM

Conference · Wed Dec 01 04:00:00 EST 1993

OSTI ID:10122372

McGibbon, M M; Browning, N D; Chisholm, M F; Pennycook, S J ^[1]; Ravikumar, V; Dravid, V P ^[2]

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1. Oak Ridge National Lab., TN (United States)
2. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering

The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO{sub 3} bicrystal.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 10122372
• Report Number(s): CONF-931108--69; ON: DE94006563
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400101
ACTIVATION, NUCLEAR REACTION, RADIOMETRIC, AND RADIOCHEMICAL PROCEDURES
BICRYSTALS
ENERGY-LOSS SPECTROSCOPY
GRAIN BOUNDARIES
IMAGES
INTERFACES
MICROANALYSIS
SCANNING ELECTRON MICROSCOPY
STRONTIUM TITANATES
STRUCTURE AND PHASE STUDIES
TRANSMISSION ELECTRON MICROSCOPY